Abram Lockhart Falk

US Patent:

20200363507, Nov 19, 2020

Filed:

May 17, 2019

Appl. No.:

16/415161

Inventors:

- Armonk NY, US
Abram L. Falk - Port Chester NY, US

International Classification:

G01S 7/484
G01S 17/10

Abstract:

A light detection and ranging (LiDAR) system is provided. The LiDAR system includes an emitter for emitting a light beam, a configurable light processing control unit to affect the light beam, a receiver for receiving the light beam and a computer system. The computer system controls operations of the light processing control unit, computes a distance to a target using a time of flight of the light beam from the emitter to the target and from the target to the receiver and simultaneously corroborates the computed distance by controlling the operations of the light processing control unit to focus and defocus the light beam.

US Patent:

20190234800, Aug 1, 2019

Filed:

Apr 10, 2019

Appl. No.:

16/380042

Inventors:

- Armonk NY, US
Abram L. Falk - Port Chester NY, US
Damon B. Farmer - White Plains NY, US
Shu-Jen Han - Cortlandt Manor NY, US
George S. Tulevski - Croton-on-Hudson NY, US

International Classification:

G01J 5/00
G01J 5/20
G01J 5/02

Abstract:

A computer-implemented method of forming a thermal-based electronic image of an object that includes receiving electromagnetic radiation emitted by the object at an optically sensitive layer including a superpixel having a plurality of pixels. Each pixel of the plurality of pixels includes a plasmonic absorber having a characteristic resonance wavelength and that generates a radiance measurement of the electromagnetic radiation at its characteristic resonance wavelength. The method further provides for determining, at a processor, an emissivity and temperature for the electromagnetic radiation received at the superpixel using the radiance measurements obtained at the pixels of the superpixel. In addition, the method provides for forming an image of the object from the determined emissivity and temperature.

US Patent:

20190234801, Aug 1, 2019

Filed:

Apr 10, 2019

Appl. No.:

16/380046

Inventors:

- Armonk NY, US
Abram L. Falk - Port Chester NY, US
Damon B. Farmer - White Plains NY, US
Shu-Jen Han - Cortlandt Manor NY, US
George S. Tulevski - Croton-on-Hudson NY, US

International Classification:

G01J 5/00
G01J 5/20
G01J 5/02

Abstract:

A computer-eimplemented thermal imaging device having an optically-sensitive layer that includes a superpixel having at least one pixel. The at least one pixel includes a plasmonic absorber configured to obtain radiance measurements of electromagnetic radiation emitted from an object at a plurality of wavelengths. The device further includes a processor configured to determine an emissivity and temperature for the electromagnetic radiation received at the plasmonic material from the object using the radiance measurements and to form an image of the object from the determined emissivity and temperature.

US Patent:

20190004068, Jan 3, 2019

Filed:

Jun 28, 2017

Appl. No.:

15/635447

Inventors:

- ARMONK NY, US
ABRAM L. FALK - PORT CHESTER NY, US
BHARAT KUMAR - TARRYTOWN NY, US

International Classification:

G01N 33/84
H01L 29/66
H01L 29/06
G01N 27/414

Abstract:

Embodiments of the invention are directed to a solid-state zinc sensor. A non-limiting example of the sensor includes a semiconductor substrate. The sensor can also include an assembly surface on the semiconductor substrate. The sensor can also include a zinc detection monolayer chemically bound to the assembly surface. The sensor can also include a power supply electrically connected to the semiconductor substrate.

US Patent:

20190004069, Jan 3, 2019

Filed:

Nov 2, 2017

Appl. No.:

15/801392

Inventors:

- Armonk NY, US
Abram L. FALK - PORT CHESTER NY, US
Bharat KUMAR - TARRYTOWN NY, US

International Classification:

G01N 33/84
G01N 27/414
H01L 29/66
H01L 29/06

Abstract:

Embodiments of the invention are directed to a solid-state zinc sensor. A non-limiting example of the sensor includes a semiconductor substrate. The sensor can also include an assembly surface on the semiconductor substrate. The sensor can also include a zinc detection monolayer chemically bound to the assembly surface. The sensor can also include a power supply electrically connected to the semiconductor substrate.

US Patent:

20180188171, Jul 5, 2018

Filed:

Jan 3, 2017

Appl. No.:

15/396902

Inventors:

- Armonk NY, US
Abram L. Falk - New Britain CT, US
Damon B. Farmer - Eastchester NY, US
Shu-Jen Han - Cortlandt Manor NY, US
George S. Tulevski - Croton-on-Hudson NY, US

International Classification:

G01N 21/552

Abstract:

A chemical sensor, methods of forming the same, and methods of performing chemical detection include a carbon nanotube test surface. A detector is configured to receive a signal from the carbon nanotube test surface responsive to illumination on the nanotube test surface. A matching module is configured to determine whether a chemical is present at the carbon nanotube test surface based on a comparison between the signal and a spectral profile of the chemical.