Christopher D Miles

US Patent:

7689022, Mar 30, 2010

Filed:

Mar 14, 2003

Appl. No.:

10/389194

Inventors:

Nathan K. Weiner - Upton MA, US
Patrick J. Odoy - Rowley MA, US
Erik Schultz - North Andover MA, US
Mark Jones - Reading MA, US
James Overbeck - Hingham MA, US
Herman Deweerd - Bedford MA, US
David A. Stura - North Billerica MA, US
Albert Bukys - Lexington MA, US
Tim Woolaver - Billerica MA, US
Thomas P. Regan - Dover MA, US
David Bradbury - Ipswich MA, US
Eric Earl McKenzie - Dunstable MA, US
Roger DiPaolo - Leominster MA, US
Christopher Miles - Acton MA, US
Joel Katz - Stoneham MA, US
Ksenia Oleink-Ovod - Newton MA, US

Assignee:

Affymetrix, Inc. - Santa Clara CA

International Classification:

G06K 9/00

US Classification:

382133, 382255

Abstract:

An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.

US Patent:

7871812, Jan 18, 2011

Filed:

Oct 27, 2004

Appl. No.:

10/975788

Inventors:

Nathan K. Weiner - Upton MA, US
Patrick J. Odoy - Rowley MA, US
Eric Schultz - North Andover MA, US
Mark Jones - Reading MA, US
James Overbeck - Hingham MA, US
Herman Deweerd - Bedford MA, US
David A. Stura - North Billerica MA, US
Albert Bukys - Lexington MA, US
Tim Woolaver - Billerica MA, US
Thomas P. Regan - Dover MA, US
David Bradbury - Ipswich MA, US
Eric Earl McKenzie - Dunstable MA, US
Roger DiPaolo - Leominister MA, US
Christopher Miles - Acton MA, US
Joel M. Katz - Stoneham MA, US
Ksenia Oleink-Ovod - Newton MA, US

Assignee:

Affymetrix, Inc. - Santa Clara CA

International Classification:

C12M 1/34
C12M 3/00

US Classification:

4352872

Abstract:

An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.

US Patent:

7983467, Jul 19, 2011

Filed:

Feb 11, 2010

Appl. No.:

12/704350

Inventors:

Nathan K. Weiner - Upton MA, US
Patrick J. Odoy - Rowley MA, US
Eric Schultz - North Andover MA, US
Mark Jones - Reading MA, US
James Overbeck - Hingham MA, US
Herman Deweerd - Bedford MA, US
David A. Stura - North Billerica MA, US
Albert Bukys - Lexington MA, US
Tim Woolaver - Billerica MA, US
Thomas P. Regan - Dover MA, US
David Bradbury - Ipswich MA, US
Eric Earl McKenzie - Dunstable MA, US
Roger DiPaolo - Leominister MA, US
Christopher Miles - Acton MA, US
Joel M. Katz - Stoneham MA, US
Ksenia Oleink-Ovod - Newton MA, US

Assignee:

Affymetrix, Inc. - Santa Clara CA

International Classification:

G06K 9/00

US Classification:

382133, 382293

Abstract:

An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.

US Patent:

8391582, Mar 5, 2013

Filed:

May 25, 2012

Appl. No.:

13/480888

Inventors:

Nathan K. Weiner - Upton MA, US
Patrick J. Odoy - Rowley MA, US
Eric Schultz - North Andover MA, US
Mark Jones - Reading MA, US
James T. Overbeck - Hingham MA, US
Herman DeWeerd - Bedford MA, US
David A. Stura - North Billerica MA, US
Albert K. Bukys - Lexington MA, US
Tim J. Woolaver - Billerica MA, US
Thomas P. Regan - Dover MA, US
David Bradbury - Ipswich MA, US
Eric E. McKenzie - Malden MA, US
Roger DiPaolo - Leominster MA, US
Christopher Miles - Acton MA, US
Joel M. Katz - Stoneham MA, US

Assignee:

Affymetrix, Inc. - Santa Clara CA

International Classification:

G06K 9/00

US Classification:

382133, 2502014

Abstract:

An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.

US Patent:

8208710, Jun 26, 2012

Filed:

Jun 9, 2011

Appl. No.:

13/156928

Inventors:

Nathan K. Weiner - Upton MA, US
Patrick J. Odoy - Rowley MA, US
Eric Schultz - North Andover MA, US
Mark Jones - Reading MA, US
James T. Overbeck - Hingham MA, US
Herman DeWeerd - Bedford MA, US
David A. Stura - North Billerica MA, US
Albert K. Bukys - Lexington MA, US
Tim J. Woolaver - Billerica MA, US
Thomas P. Regan - Dover MA, US
David Bradbury - Ipswich MA, US
Eric E. McKenzie - Malden MA, US
Roger DiPaolo - Leominster MA, US
Christopher Miles - Acton MA, US
Joel M. Katz - Stoneham MA, US
Ksenia Oleinik-Ovod - Newton MA, US

Assignee:

Affymetrix, Inc. - Santa Clara CA

International Classification:

G06K 9/00

US Classification:

382133, 382291

Abstract:

An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.