Christopher J Miles

US Patent:

20050030601, Feb 10, 2005

Filed:

Jun 14, 2004

Appl. No.:

10/868590

Inventors:

David Smith - Ramsey NJ, US
Gregory Loney - Concord MA, US
Nathan Weiner - Upton MA, US
Christopher Miles - Acton MA, US
Albert Bukys - Lexington MA, US
Akim Lennhoff - Cambridge MA, US
Robert Kuimelis - Palo Alto CA, US

Assignee:

Affymetrix, INC. - Santa Clara CA

International Classification:

G06F015/00

US Classification:

358504000, 358001900

Abstract:

In one embodiment a method for reducing variation in a plurality of scanners is described. The method comprises directing an excitation beam at a calibration standard in each of the plurality of scanners, where one of the plurality of scanners is a designated scanner; detecting emission data for each of the plurality of scanners from a plurality of fluorescent molecules disposed on the calibration standard, where the emission data is responsive to the excitation beam; determining variation in the emission data of one or more of the plurality of scanners based, at least in part, upon the emission data of the designated scanner; and adjusting one or more parameters in one or more of the plurality of scanners based, at least in part, upon the determined variation.