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Gerald N Wallmark

age ~79

from Manchester, CT

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Also known as:
  • Gerald Norman Wallmark
Related to:
Connected to:

Gerald Wallmark Phones & Addresses

  • Manchester, CT
  • Austin, TX
  • 13289 Fieldstone Way, Gainesville, VA 20155 • (703)7432110
  • 38 Toddy Hill Rd, Sandy Hook, CT 06482 • (203)4261777
  • 2112 Randolph Rd, Silver Spring, MD 20902 • (301)9490107
  • Monroe, CT
  • Belmont, MA
  • Prince William, VA
  • Stamford, CT

Work

  • Company:
    The aerospace corporation
    Jun 2005 to May 2012
  • Position:
    Senior project engineer

Education

  • Degree:
    Master of Science, Masters
  • School / High School:
    Rensselaer Polytechnic Institute
  • Specialities:
    Physics

Skills

Systems Engineering • Aerospace • Dod • Spacecraft • Security Clearance • Integration • Program Management • Information Assurance • Defense • Requirements Analysis • Government Contracting • Proposal Writing • Military • Project Management • Process Improvement • Government • Resource Management • Analysis

Industries

Defense & Space

Resumes

Gerald Wallmark Photo 1

Rensselaer Polytechnic Institute

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Location:
147 John Olds Dr, Manchester, CT 06042
Industry:
Defense & Space
Work:
The Aerospace Corporation Jun 2005 - May 2012
Senior Project Engineer
Image Graphics Nov 1981 - Feb 2004
Program Manager and Senior Systems Engineer
Nov 1981 - Feb 2004
Rensselaer Polytechnic Institute
Education:
Rensselaer Polytechnic Institute
Master of Science, Masters, Physics Rensselaer Polytechnic Institute
Bachelors, Bachelor of Science, Physics
Skills:
Systems Engineering
Aerospace
Dod
Spacecraft
Security Clearance
Integration
Program Management
Information Assurance
Defense
Requirements Analysis
Government Contracting
Proposal Writing
Military
Project Management
Process Improvement
Government
Resource Management
Analysis

Us Patents

  • System For Contactless Testing Of Printed Circuit Boards

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  • US Patent:
    6621274, Sep 16, 2003
  • Filed:
    Nov 8, 2001
  • Appl. No.:
    10/008760
  • Inventors:
    Gerald N. Wallmark - Sandy Hook CT
  • Assignee:
    Image Graphics Incorporated - Shelton CT
  • International Classification:
    G01R 31305
  • US Classification:
    324501, 324751
  • Abstract:
    A system for testing for opens in and shorts between conductor traces on a printed circuit board includes an electron gun assembly for generating an electron beam and an electron optics assembly for directing the beam to the traces which have a reference potential. A grid located proximate to and substantially parallel with the surface of the board is placed at a first potential before the beam is directed to a first point on a trace to charge the trace to a first potential. The grid is then placed at a second potential, the second potential being between the reference potential and the first potential, before the beam is directed to a second point on the trace to cause emission of secondary electrons. The secondary electrons that reach the grid are collected thereby, and signal processing electronics are used to determine whether or not an open or short exists.

  • System For Contactless Testing Of Printed Circuit Boards

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  • US Patent:
    6359451, Mar 19, 2002
  • Filed:
    Feb 11, 2000
  • Appl. No.:
    09/503102
  • Inventors:
    Gerald N. Wallmark - Sandy Hook CT
  • Assignee:
    Image Graphics Incorporated - Shelton CT
  • International Classification:
    G01R 31305
  • US Classification:
    324751
  • Abstract:
    A system for testing for opens in and shorts between conductor traces on a printed circuit board is provided. The system includes an electron gun assembly for generating an electron beam and an electron optics assembly for directing the electron beam to the traces on the surface of the board, the traces having a reference potential. A grid located proximate to and substantially parallel with the surface of the board is placed at a first potential before the electron beam is directed to a first point on a trace to charge the trace to a first potential. The grid is then placed at a second potential, the second potential being between the reference potential and the first potential, before the electron beam is directed to a second point on the trace to cause emission of secondary electrons. The secondary electrons that reach the grid are collected by the grid, and signal processing electronics and a CPU are used to determine whether or not an open or short exists depending on whether secondary electrons are collected by the grid as the electron beam is directed to various locations on the traces. The position and intensity of the electron beam are controlled by a raster/vector generator.
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