Jason D Campbell

US Patent:

20080306750, Dec 11, 2008

Filed:

Jun 8, 2007

Appl. No.:

11/760512

Inventors:

Casey Wunder - Denver CO, US
Robert Piecuch - Wellington CO, US
Michelle H. Oldham - Fort Collins CO, US
Kathryn M. Carlson - Fort Collins CO, US
Mark T. Seib - Johnstown CO, US
Tracy R. Nicolls - Windsor CO, US
Jason C. Campbell - Fort Collins CO, US
Margaret Launer - Windsor CO, US

Assignee:

ADP, Inc. - Roseland NJ

International Classification:

G06Q 10/00

US Classification:

705 1

Abstract:

A system and method for screening candidates for compliance with general, employer specific, and/or position specific policies. Such policies may be applicable to job applicants, potential contractors, existing employees, and/or existing contractors (collectively, “candidates”), and may be influenced by law or by best practices. The system compiles data based on the policies from both automatic and other data sources. The system also automatically rates the results of the data compiled. Through the use of the system, employers may easily obtain relevant information about candidates prior to engagement or during engagement of the candidate and without the requirement that the employer manually analyze screening results.

US Patent:

20160209275, Jul 21, 2016

Filed:

Jan 14, 2016

Appl. No.:

14/995861

Inventors:

- GAITHERSBURG MD, US
JASON T. RYAN - FREDERICK MD, US
JASON CAMPBELL - FREDERICK MD, US

International Classification:

G01J 9/02

Abstract:

A phase shift detector includes: an interferometer; and a microwave probe in electrical communication with the interferometer, the microwave probe including: a primary shield electrode; and a transmission electrode disposed proximate to the primary shield electrode, the transmission electrode and the primary shield electrode being exposed and arranged to produce an electric field, wherein the transmission electrode is isolated electrically from the primary shield electrode. A process for acquiring phase shift data includes: receiving a microwave radiation by a power splitter; producing a reference microwave radiation and a sample microwave radiation; communicating the reference microwave radiation to a reference arm; communicating the sample radiation to a sample arm; communicating the sample radiation from the sample arm to a microwave probe; subjecting a sample to the sample microwave radiation; producing a probe microwave radiation in response to subjecting the sample to the sample microwave radiation; communicating the probe microwave radiation to a power combiner; receiving the probe microwave radiation and the reference microwave radiation from the reference arm; and producing an interferometer signal in response to receiving the probe microwave radiation and the reference microwave radiation to acquire phase shift data.

US Patent:

20140210473, Jul 31, 2014

Filed:

Apr 3, 2014

Appl. No.:

14/244494

Inventors:

JASON P. CAMPBELL - FREDERICK MD, US
KIN P. CHEUNG - ROCKVILLE MD, US
JASON T. RYAN - FREDERICK MD, US
PATRICK M. LENAHAN - BOALSBURY PA, US

Assignee:

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY - GAITHERSBURG MD

International Classification:

G01R 33/60

US Classification:

324316, 324318

Abstract:

An electron spin resonance spectrometer includes a bridge to transmit an excitation frequency and to receive a signal frequency; a probe electrically connected to the bridge and comprising: a first conductor in electrical communication with the bridge to transmit the signal frequency to the bridge; a shorting member electrically connected to the first conductor to transmit the excitation frequency to a sample, to produce the signal frequency, and to transmit the signal frequency to the first conductor; and a second conductor electrically connected to the shorting member; and a magnet disposed proximate to the probe.