Joseph F Wardell

US Patent:

20060060055, Mar 23, 2006

Filed:

Sep 22, 2004

Appl. No.:

10/947466

Inventors:

Joseph Wardell - Cypress CA, US
Tiencheng Wang - Rolling Hills Estates CA, US

International Classification:

B29C 63/00
B32B 43/00

US Classification:

083703000, 156584000

Abstract:

The invention is a device for peeling one or more individual layers of a multilayer shim. In detail the device includes a platform having a surface with a recess. A mechanism is mounted in the recess for mounting the shim and a moving the shim upward such that a portion of the shim is above the surface. A blade assembly is rotatably mounted to the platform, which is rotatable in a plane parallel to the surface. The blade assembly includes a cutting blade mounted thereon, such that said blade is in slidable contact with the surface and movable over the recess. Thus shim can be raised by the mechanism and the portion of the shim requiring removal can be raised above the surface and the blade assembly thereafter can be rotated causing the cutting blade to shear off the portion of the shim above the surface.

US Patent:

20090198465, Aug 6, 2009

Filed:

Jan 31, 2008

Appl. No.:

12/012040

Inventors:

Doug Dean Decker - Redondo Beach CA, US
Timothy Jackson Shinbara - El Segundo CA, US
Joseph Paul Wardell - Cypress CA, US

International Classification:

G06F 19/00

US Classification:

702 84

Abstract:

A manufacturing quality control system for monitoring the proximity of a workpiece to a machine tool is disclosed. The system includes a proximity sensor attached to the machine tool for deriving a first distance measurement based upon the distance between the workpiece and the machine tool. A wireless transmitter generates a radio frequency signal including the first distance measurement. A remote data processing device communicates with the wireless transmitter to retrieve the first distance measurement and display various derivations of sensor data.