Lu Chen

age ~36

from San Mateo, CA

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Lu Chen Phones & Addresses

San Mateo, CA
46 Beta Ave, Daly City, CA 94014
Mountain View, CA

Lawyers & Attorneys

Lu Chen - Lawyer

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ISLN:

924302662

Admitted:

2012

Lu Chen - Lawyer

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Office:

Fasken Martineau DuMoulin LLP

Specialties:

Banking & Finance

ISLN:

922297281

University:

Heilongjiang University, China, 2003; Seneca College, 2008; Seneca College, 2008

Wikipedia References

Lu Chen

Work:

Company:

University of California, Berkeley

Position:

Neuroscientist

Education:

Studied at:

University of Southern California

Academic degree:

Professor • PHD

Skills & Activities:

Achieved status:

MacArthur Fellow

Preference:

Associate

Lu Chen

About:

Born:

20 September 1987 • Harbin , Heilongjiang , People's Republic of China

Work:

Position:

Television actor from Heilongjiang • Film actor from Heilongjiang • Actress

Education:

Specialty:

Photographer

Area of science:

Television

Skills & Activities:

Lu was discovered by a principal photographer of the television series " Eternal Beauty " in 2006 and was invited the participate in the project.

Lu Chen (Scientist)

Us Patents

System And Method For Wide-Range High-Accuracy-Low-Dropout Current Regulation
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US Patent:

7839097, Nov 23, 2010
Filed:

Jan 31, 2008
Appl. No.:

12/012394
Inventors:

Lu Chen - San Jose CA, US
Kin Edward Shum - Palo Alto CA, US
Assignee:

Kinetic Technologies - Sunnyvale CA
International Classification:

H05B 37/02
US Classification:

315291, 315287, 315307, 323274, 323282
Abstract:

The invention teaches a semiconductor circuit for driving an LED in which the current passing through the LED is regulated by adjusting the NMOS Rdson using a series of digital signals. The circuit maintains a high current accuracy over wide range of current changes while keeping a low voltage drop.

Adaptive Frequency Compensation For Dc-To-Dc Converter
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US Patent:

7880446, Feb 1, 2011
Filed:

Feb 10, 2006
Appl. No.:

11/352031
Inventors:

Lu Chen - San Jose CA, US
Bruno Ferrario - Cupertino CA, US
Assignee:

Vishay-Siliconix - Santa Clara CA
International Classification:

H01M 10/46
US Classification:

320166
Abstract:

One embodiment of the invention is a compensation circuit that includes a comparator that is coupled to receive a reference voltage. The compensation circuit can also include a capacitance coupled to receive a feedback voltage associated with an output voltage of a converter. Furthermore, the compensation circuit can include an adjustable resistance that is coupled to the capacitance and to the comparator.

Adaptive Frequency Compensation For Dc-To-Dc Converter
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US Patent:

7960947, Jun 14, 2011
Filed:

Sep 30, 2009
Appl. No.:

12/571194
Inventors:

Lu Chen - San Jose CA, US
Bruno Ferrario - Cupertino CA, US
Assignee:

Vishay-Siliconix - Santa Clara CA
International Classification:

H01M 10/46
US Classification:

320166
Abstract:

One embodiment of the invention is a compensation circuit that includes a comparator that is coupled to receive a reference voltage. The compensation circuit can also include a capacitance coupled to receive a feedback voltage associated with an output voltage of a converter. Furthermore, the compensation circuit can include an adjustable resistance that is coupled to the capacitance and to the comparator.

Systems And Methods For Detecting Defects On A Wafer
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US Patent:

8223327, Jul 17, 2012
Filed:

Jan 26, 2009
Appl. No.:

12/359476
Inventors:

Lu Chen - Sunnyvale CA, US
Jason Kirkwood - Santa Clara CA, US
Mohan Mahadevan - Livermore CA, US
James A. Smith - Los Altos CA, US
Lisheng Gao - Morgan Hill CA, US
Junqing (Jenny) Huang - Fremont CA, US
Tao Luo - Fremont CA, US
Richard Wallingford - San Jose CA, US
Assignee:

KLA-Tencor Corp. - San Jose CA
International Classification:

G01N 21/00
US Classification:

3562372, 3562373
Abstract:

Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

Systems And Methods For Detecting Defects On A Wafer
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US Patent:

8467047, Jun 18, 2013
Filed:

Jul 3, 2012
Appl. No.:

13/541579
Inventors:

Lu Chen - Sunnyvale CA, US
Jason Kirkwood - Santa Clara CA, US
Mohan Mahadevan - Livermore CA, US
James A. Smith - Los Altos CA, US
Lisheng Gao - Morgan Hill CA, US
Junqing (Jenny) Huang - Fremont CA, US
Tao Luo - Fremont CA, US
Richard Wallingford - San Jose CA, US
Assignee:

KLA-Tencor Corp. - San Jose CA
International Classification:

G01N 21/00
US Classification:

3562372, 3562373
Abstract:

Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

Detecting Defects On A Wafer
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US Patent:

8605275, Dec 10, 2013
Filed:

Jul 28, 2011
Appl. No.:

13/193492
Inventors:

Lu Chen - Sunnyvale CA, US
Qiang Zhang - Fremont CA, US
Assignee:

KLA-Tencor Corp. - Milpitas CA
International Classification:

G01N 21/00
US Classification:

3562372, 3562373
Abstract:

Systems and methods for detecting defects on a wafer are provided. One method includes combining first image data and second image data, generated using different output generated using different values for focus of an inspection system, corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer and detecting defects on the wafer using the additional image data.

Boost Regulator With Integrated Load Switch
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US Patent:

20070236191, Oct 11, 2007
Filed:

Apr 11, 2006
Appl. No.:

11/279375
Inventors:

Tim Yu - Fremont CA, US
Lu Chen - San Jose CA, US
Assignee:

Advanced Analogic Technologies, Inc. - Sunnyvale CA
International Classification:

G05F 1/00
US Classification:

323282000
Abstract:

A boost regulator includes a diode D connected between a node Vand an output node V. The node Vis connected to ground by a first switch MA second switch Mand an inductor L are connected in series between the node Vand an input node V. The regulator has an enabled state and a disabled state. In the enabled stage, a control circuit turns the second switch on and drives the first switch using a PFM, PWM or other strategy. In the disabled state, control circuit turns the second switch off to prevent current passing through the regulator to the load.

System, Method And Computer Program Product For Associating A Record With An Account From An On-Demand Database System
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US Patent:

20110238622, Sep 29, 2011
Filed:

Nov 18, 2010
Appl. No.:

12/949723
Inventors:

Jeanine Walters - San Francisco CA, US
Pratima Arora - Sunnyvale CA, US
Don C. Jay - San Francisco CA, US
Herman Kwong - Danville CA, US
John Liang - Castro Valley CA, US
Yuan (Peter) Wang - Alameda CA, US
Rachna Singh - Foster City CA, US
Lu Ping Chen - Oakland CA, US
Frank Lopez - San Francisco CA, US
Assignee:

SALESFORCE.COM, INC. - San Francisco CA
International Classification:

G06F 17/30
US Classification:

707610, 707769, 707E17005, 707E17014
Abstract:

In accordance with embodiments, there are provided mechanisms and methods for associating a record with an account from an on-demand database system. These mechanisms and methods for associating a record with an account from an on-demand database system can enable improved synchronization between an on-demand database system and a software element separate from the on-demand database system, etc.