Lu Chein Chen

US Patent:

7839097, Nov 23, 2010

Filed:

Jan 31, 2008

Appl. No.:

12/012394

Inventors:

Lu Chen - San Jose CA, US
Kin Edward Shum - Palo Alto CA, US

Assignee:

Kinetic Technologies - Sunnyvale CA

International Classification:

H05B 37/02

US Classification:

315291, 315287, 315307, 323274, 323282

Abstract:

The invention teaches a semiconductor circuit for driving an LED in which the current passing through the LED is regulated by adjusting the NMOS Rdson using a series of digital signals. The circuit maintains a high current accuracy over wide range of current changes while keeping a low voltage drop.

US Patent:

7880446, Feb 1, 2011

Filed:

Feb 10, 2006

Appl. No.:

11/352031

Inventors:

Lu Chen - San Jose CA, US
Bruno Ferrario - Cupertino CA, US

Assignee:

Vishay-Siliconix - Santa Clara CA

International Classification:

H01M 10/46

US Classification:

320166

Abstract:

One embodiment of the invention is a compensation circuit that includes a comparator that is coupled to receive a reference voltage. The compensation circuit can also include a capacitance coupled to receive a feedback voltage associated with an output voltage of a converter. Furthermore, the compensation circuit can include an adjustable resistance that is coupled to the capacitance and to the comparator.

US Patent:

7960947, Jun 14, 2011

Filed:

Sep 30, 2009

Appl. No.:

12/571194

Inventors:

Lu Chen - San Jose CA, US
Bruno Ferrario - Cupertino CA, US

Assignee:

Vishay-Siliconix - Santa Clara CA

International Classification:

H01M 10/46

US Classification:

320166

Abstract:

One embodiment of the invention is a compensation circuit that includes a comparator that is coupled to receive a reference voltage. The compensation circuit can also include a capacitance coupled to receive a feedback voltage associated with an output voltage of a converter. Furthermore, the compensation circuit can include an adjustable resistance that is coupled to the capacitance and to the comparator.

US Patent:

8223327, Jul 17, 2012

Filed:

Jan 26, 2009

Appl. No.:

12/359476

Inventors:

Lu Chen - Sunnyvale CA, US
Jason Kirkwood - Santa Clara CA, US
Mohan Mahadevan - Livermore CA, US
James A. Smith - Los Altos CA, US
Lisheng Gao - Morgan Hill CA, US
Junqing (Jenny) Huang - Fremont CA, US
Tao Luo - Fremont CA, US
Richard Wallingford - San Jose CA, US

Assignee:

KLA-Tencor Corp. - San Jose CA

International Classification:

G01N 21/00

US Classification:

3562372, 3562373

Abstract:

Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

US Patent:

8467047, Jun 18, 2013

Filed:

Jul 3, 2012

Appl. No.:

13/541579

Inventors:

Lu Chen - Sunnyvale CA, US
Jason Kirkwood - Santa Clara CA, US
Mohan Mahadevan - Livermore CA, US
James A. Smith - Los Altos CA, US
Lisheng Gao - Morgan Hill CA, US
Junqing (Jenny) Huang - Fremont CA, US
Tao Luo - Fremont CA, US
Richard Wallingford - San Jose CA, US

Assignee:

KLA-Tencor Corp. - San Jose CA

International Classification:

G01N 21/00

US Classification:

3562372, 3562373

Abstract:

Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

US Patent:

8605275, Dec 10, 2013

Filed:

Jul 28, 2011

Appl. No.:

13/193492

Inventors:

Lu Chen - Sunnyvale CA, US
Qiang Zhang - Fremont CA, US

Assignee:

KLA-Tencor Corp. - Milpitas CA

International Classification:

G01N 21/00

US Classification:

3562372, 3562373

Abstract:

Systems and methods for detecting defects on a wafer are provided. One method includes combining first image data and second image data, generated using different output generated using different values for focus of an inspection system, corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer and detecting defects on the wafer using the additional image data.

US Patent:

20070236191, Oct 11, 2007

Filed:

Apr 11, 2006

Appl. No.:

11/279375

Inventors:

Tim Yu - Fremont CA, US
Lu Chen - San Jose CA, US

Assignee:

Advanced Analogic Technologies, Inc. - Sunnyvale CA

International Classification:

G05F 1/00

US Classification:

323282000

Abstract:

A boost regulator includes a diode D connected between a node Vand an output node V. The node Vis connected to ground by a first switch MA second switch Mand an inductor L are connected in series between the node Vand an input node V. The regulator has an enabled state and a disabled state. In the enabled stage, a control circuit turns the second switch on and drives the first switch using a PFM, PWM or other strategy. In the disabled state, control circuit turns the second switch off to prevent current passing through the regulator to the load.

US Patent:

20110238622, Sep 29, 2011

Filed:

Nov 18, 2010

Appl. No.:

12/949723

Inventors:

Jeanine Walters - San Francisco CA, US
Pratima Arora - Sunnyvale CA, US
Don C. Jay - San Francisco CA, US
Herman Kwong - Danville CA, US
John Liang - Castro Valley CA, US
Yuan (Peter) Wang - Alameda CA, US
Rachna Singh - Foster City CA, US
Lu Ping Chen - Oakland CA, US
Frank Lopez - San Francisco CA, US

Assignee:

SALESFORCE.COM, INC. - San Francisco CA

International Classification:

G06F 17/30

US Classification:

707610, 707769, 707E17005, 707E17014

Abstract:

In accordance with embodiments, there are provided mechanisms and methods for associating a record with an account from an on-demand database system. These mechanisms and methods for associating a record with an account from an on-demand database system can enable improved synchronization between an on-demand database system and a software element separate from the on-demand database system, etc.