Robert J Atkinson

US Patent:

6717663, Apr 6, 2004

Filed:

Mar 8, 2002

Appl. No.:

10/094213

Inventors:

Robert C. Atkinson - Buffalo NY
Thomas E. Ryan - Batavia NY
Keshav Sharma - Lancaster NY
Michael J. Byrne - East Aurora NY

Assignee:

Reichert, Inc. - Depew NY

International Classification:

G01N 2141

US Classification:

356136

Abstract:

An optical configuration for differential refractive index measurements of a test sample relative to a reference sample comprises an optical path along which an illumination beam travels to simultaneously illuminate a pair of optical interfaces on opposite sides of a meridional plane corresponding to the test sample and reference sample, respectively. Partial beams leaving the optical interfaces are optically diverged to illuminate different segments of a linear scanned array aligned in the meridional plane. The difference in location of a pair of shadowlines or a pair of resonance minimums formed by the partial beams on the array provides an indication of the refractive index difference.

US Patent:

6734956, May 11, 2004

Filed:

May 6, 2002

Appl. No.:

10/139577

Inventors:

Michael J. Byrne - East Aurora NY
Keshav D. Sharma - Lancaster NY
Robert C. Atkinson - Buffalo NY
Bruce R. Cordier - West Seneca NY

Assignee:

Reichert, Inc. - Depew NY

International Classification:

G01N 2141

US Classification:

356128, 356135

Abstract:

An optical configuration for measuring a difference in refractive index between a first sample and a second sample comprises partitioned first and second optical interfaces symmetrically illuminated by an illumination beam to provide first and second partial beams defined by the refractive index of the first and second samples, respectively. A linear scanned array is aligned in a meridional plane of the optical configuration for detection purposes, and an optical multiplexor is provided upstream of the linear scanned array for receiving the first and second partial beams and defining first and second optical channels carrying optical signal information corresponding to the first and second partial beams. The optical multiplexor switches between optical channels, such that the linear scanned array detects either the first or second optical channel at a given time. Thus, differential measurements are possible using a single linear array.

US Patent:

20030112427, Jun 19, 2003

Filed:

Oct 7, 2002

Appl. No.:

10/266170

Inventors:

Thomas Ryan - Batavia NY, US
Michael Byrne - East Aurora NY, US
Robert Atkinson - Buffalo NY, US

International Classification:

G01N021/41

US Classification:

356/128000, 356/136000

Abstract:

A sensor apparatus and associated method for sensing and monitoring specific binding of analyte to an immobilized binding layer are disclosed. The apparatus preferably comprises an automatic critical angle refractometer having a linear scanned array and an optical system for illuminating a portion of the array, which illumination depends upon the refractive index of the binding layer deposited on an optically transparent element. The apparatus further includes a flow cell for bringing the analyte in contact with the binding layer. The apparatus also includes a computer for receiving and processing refractive index data from the critical angle refractometer during the reaction between the analyte and the layer, which computer may be peripherally connected to the refractometer or enclosed within the refractometer housing. A preferred sensing method of the present invention generally comprises providing a critical angle refractometer generating light impinging upon the immobilized binding layer, contacting the binding layer with a contacting phase, measuring the critical angle of total reflection, which measurements are indicative of the presence or absence of interactions between the analyte and the binding layer.

US Patent:

20030206291, Nov 6, 2003

Filed:

May 6, 2002

Appl. No.:

10/139268

Inventors:

Michael Byrne - East Aurora NY, US
Keshav Sharma - Lancaster NY, US
Robert Atkinson - Buffalo NY, US

Assignee:

Leica Microsystems Inc. - Depew NY

International Classification:

G01N021/41

US Classification:

356/136000

Abstract:

An optical configuration for measuring a difference in refractive index between a first sample and a second sample comprises partitioned first and second optical interfaces symmetrically illuminated by an illumination beam to provide first and second partial beams defined by the refractive index of the first and second samples, respectively. First and second linear scanned arrays are positioned on opposite sides of a meridional plane of the optical configuration for respectively detecting the first and second partial beams. Thus, differential measurements are possible based on signal information from the arrays. Embodiments for critical angle and surface plasmon resonance refractive index measurements are disclosed. The disclosure also relates to methods for measuring a difference in refractive index between a first sample and a second sample in accordance with the described optical configuration embodiments.

US Patent:

20040036881, Feb 26, 2004

Filed:

Aug 22, 2002

Appl. No.:

10/225699

Inventors:

Keshav Sharma - Lancaster NY, US
Robert Atkinson - Buffalo NY, US
Richard Lesch - Lancaster NY, US

Assignee:

Leica Microsystems Inc. - Depew NY

International Classification:

G01N021/55

US Classification:

356/445000

Abstract:

A method and apparatus for determining a characteristic of a substance is disclosed. The apparatus comprises a light source, a prism, a sensor chip located on the prism, focusing optics located between the light source and the prism, a detector, collimating optics located between the prism and the detector, and calculation means for determining the characteristic of the substance. The sensor chip comprises a metallic film and a transparent substance. The metallic film is operatively arranged to reflect light from the light source. The transparent substance comprises a material having an index of refraction matched to an index of refraction of the prism. The sensor chip is operatively arranged to receive a sample of the substance.

US Patent:

61727466, Jan 9, 2001

Filed:

Oct 27, 1999

Appl. No.:

9/429123

Inventors:

Michael J. Byrne - East Aurora NY
Thomas E. Ryan - Batavia NY
Kyle R. Bleyle - Lancaster NY
Keshav D. Sharma - Lancaster NY
Robert C. Atkinson - Buffalo NY
David J. Cash - Kenmore NY

Assignee:

Leica Microsystems Inc. - Depew NY

International Classification:

G01N 2141

US Classification:

356135

Abstract:

A transmitted light refractometer comprises an optical system having a movable mirror for redirecting light transmitted through a light-refracting sample to a beam splitter for dividing the light between first and second detection paths. The first detection path leads to an eyepiece whereby an operator may view an illumination boundary shadowline brought into the field of view of the eyepiece by adjusting the position of the movable mirror. The second detection path leads to a light-sensitive detector, preferably a linear scanned array, for generating signal information indicative of the location of the shadowline on the detector. An optical position sensor associated with the movable mirror includes a position detector providing signal information indicative of the position of the movable mirror. During a reading, the shadowline is brought into the field of view of the eyepiece, and the shadowline signal information and the mirror position signal information are processed to calculate index of refraction of the sample.