Scott Earl Lindsey

US Patent:

6948940, Sep 27, 2005

Filed:

Apr 10, 2003

Appl. No.:

10/411175

Inventors:

Scott E. Lindsey - Brentwood CA, US
Charles A. Miller - Fremont CA, US
David M. Royster - Livermore CA, US
Stuart W. Wenzel - San Francisco CA, US

Assignee:

FormFactor, Inc. - Livermore CA

International Classification:

H01R012/00

US Classification:

439 66, 439 81, 324754, 174773

Abstract:

A microelectronic spring contact for making electrical contact between a device and a mating substrate and method of making the same are disclosed. The spring contact has a compliant pad adhered to a substrate of the device and spaced apart from a terminal of the device. The compliant pad has a base adhered to the substrate, and side surfaces extending away from the substrate and tapering to a smaller end area distal from the substrate. A trace extends from the terminal of the device in a coil pattern over the compliant pad to its end area, forming a helix. At least a portion of the compliant pad end area is covered by the trace, and a portion of the trace that is over the compliant pad is supported by the compliant pad. In an alternative embodiment, the pad is removed to leave a freestanding helical contact.

US Patent:

7053644, May 30, 2006

Filed:

Dec 15, 2004

Appl. No.:

11/013855

Inventors:

Scott E. Lindsey - Brentwood CA, US
Carl N. Buck - Cupertino CA, US
Rhea J. Posedel - Belmont CA, US

Assignee:

Aehr Test Systems - Fremont CA

International Classification:

G01R 31/02

US Classification:

324761, 324754, 3241581, 324755

Abstract:

A system for testing integrated circuits is described. A contactor board of the system has pins with ends that contact terminals on a power and signal distribution board. Opposing ends of the pins make contact with die terminals on an unsingulated wafer. The distribution board also carries a plurality of capacitors, at least one capacitor corresponding to every die on the unsingulated wafer. Each capacitor may include two substantially flat planar capacitor conductors and a dielectric layer between the capacitor conductors. Alternatively, the capacitors may be discrete components mounted to and standing above the distribution board, in which case corresponding capacitor openings are formed in the contactor substrate to accommodate the capacitors when the distribution board and the contactor board are brought together. A plurality of fuses made of a polymer material are also provided. The polymer material limits the flow of current flowing therethrough when the temperature of a fuse increases, and increases the current therethrough when the temperature of the fuse decreases.

US Patent:

7131848, Nov 7, 2006

Filed:

Sep 27, 2005

Appl. No.:

11/237091

Inventors:

Scott E. Lindsey - Brentwood CA, US
Charles A. Miller - Fremont CA, US
David M. Royster - Livermore CA, US
Stuart W. Wenzel - San Francisco CA, US

Assignee:

FormFactor, Inc. - Livermore CA

International Classification:

H01R 12/00

US Classification:

439 66, 324754

Abstract:

A microelectronic spring contact for making electrical contact between a device and a mating substrate and method of making the same are disclosed. The spring contact has a compliant pad adhered to a substrate of the device and spaced apart from a terminal of the device. The compliant pad has a base adhered to the substrate, and side surfaces extending away from the substrate and tapering to a smaller end area distal from the substrate. A trace extends from the terminal of the device in a coil pattern over the compliant pad to its end area, forming a helix. At least a portion of the compliant pad end area is covered by the trace, and a portion of the trace that is over the compliant pad is supported by the compliant pad. In an alternative embodiment, the pad is removed to leave a freestanding helical contact.

US Patent:

7667475, Feb 23, 2010

Filed:

Apr 4, 2008

Appl. No.:

12/062988

Inventors:

Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US

Assignee:

AEHR Test Systems - Fremont CA

International Classification:

G01R 31/02

US Classification:

324760, 324754, 324765

Abstract:

The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.

US Patent:

7762822, Jul 27, 2010

Filed:

Apr 27, 2006

Appl. No.:

11/413323

Inventors:

Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Long V. Vu - San Jose CA, US

Assignee:

Aehr Test Systems - Fremont CA

International Classification:

H01R 13/44

US Classification:

439131

Abstract:

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

US Patent:

7800382, Sep 21, 2010

Filed:

Dec 19, 2007

Appl. No.:

11/960453

Inventors:

Scott E. Lindsey - Brentwood CA, US
Jovan Jovanovic - Santa Clara CA, US
David S. Hendrickson - Los Gatos CA, US

Assignee:

AEHR Test Ststems - Fremont CA

International Classification:

G01R 31/02

US Classification:

324754, 324765, 324755

Abstract:

A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.

US Patent:

D629760, Dec 28, 2010

Filed:

Nov 3, 2008

Appl. No.:

29/327293

Inventors:

Scott E. Lindsey - Brentwood CA, US
Jovan Jovanovic - Santa Clara CA, US
David S. Hendrickson - Los Gatos CA, US

Assignee:

AEHR Test Systems - Fremont CA

International Classification:

1303

US Classification:

D13154

US Patent:

D630166, Jan 4, 2011

Filed:

Nov 3, 2008

Appl. No.:

29/327294

Inventors:

Scott E. Lindsey - Brentwood CA, US
Jovan Jovanovic - Santa Clara CA, US
David S. Hendrickson - Los Gatos CA, US

Assignee:

AERH Test Systems - Fremont CA

International Classification:

1303

US Classification:

D13154