Timothy O Baldwin

US Patent:

57486409, May 5, 1998

Filed:

Sep 12, 1996

Appl. No.:

8/711864

Inventors:

Chongjun (June) Jiang - Dallas TX
David A. Spilo - Austin TX
Timothy J. Baldwin - Austin TX
Robert D. Bryfogle - Austin TX
Bobby I. Pinkerton - Austin TX

Assignee:

Advanced Micro Devices - Sunnyvale CA

International Classification:

G06F 1100

US Classification:

371 213

Abstract:

A processing unit having a CPU core, an integrated RAM and a test unit, which may be implemented in either a test unit, which may be implemented in either hardware or software. A built-in self-test of the RAM is designed to run concurrently with the functional vectors used to test the CPU core. Once the core tests have been activated, a control register may be written to by which will activate the built-in self-test. Thus, the BIST and core testing may overlap to minimize test time.