Tram T Pham

US Patent:

20110281371, Nov 17, 2011

Filed:

May 21, 2011

Appl. No.:

13/113045

Inventors:

R. Aaron Falk - Newcastle WA, US
Eric Fogel - Seattle WA, US
Tram Pham - Renton WA, US

Assignee:

Emergent Detection, Inc. - Olympia WA

International Classification:

G01N 21/78

US Classification:

436169, 422 8205

Abstract:

Systems and methods for detection of human fat metabolism byproducts and analysis of the detection for optimizing dietary results. The present invention includes a compact opto-electronic based sensor to significantly increase (factor of 20 or more) the accuracy and minimal detection limits for a standard ketone test strip.

US Patent:

20110254459, Oct 20, 2011

Filed:

Apr 15, 2011

Appl. No.:

13/088176

Inventors:

R. Aaron Falk - Newcastle WA, US
Tram Pham - Renton WA, US

International Classification:

H05B 41/16
F21S 4/00

US Classification:

315250, 36231101, 36231102

Abstract:

A lamp that produces an infinitely variable range of time, space, and color patterns. The lamp includes a plurality of colored light sources that produce light in at least two different visual spectrums, a single modulation device that generates a modulation scheme for each of the plurality of light sources, a display screen, and a mask that masks off at least a portion of light illuminating the display screen. The generated modulation scheme is produced at a predefined intensity level. A controller selectively alters delivery of the modulation scheme to each of the plurality of light sources. A first switch allows a user to select one of a plurality of modulation schemes. A second switch allows a user to alter the predefined intensity level. A third switch allows a user to select one of a plurality of modulation rates.

US Patent:

20150300882, Oct 22, 2015

Filed:

Apr 18, 2014

Appl. No.:

14/256823

Inventors:

- Vista CA, US
Tram Pham - Renton WA, US
Anthony Ruiz - Vista CA, US

Assignee:

Quantum Focus Instruments Corporation - Vista CA

International Classification:

G01J 5/00
G01R 31/265

Abstract:

Dynamic Digital Modulation obtains thermal image data on active semiconductor devices with sufficient sensitivity to be used in situ with packaged devices. These techniques can be applied to dynamic failures, but can also produce quantitative data of actual power dissipation as the device is placed into different operational modes. The thermal image results can be analyzed to assist in thermal management and assessing reliability and failure analysis issues in semiconductor devices.