Andrew Waddell

US Patent:

20100057704, Mar 4, 2010

Filed:

Aug 29, 2008

Appl. No.:

12/201797

Inventors:

Paul Kingston Duffie - Palo Alto CA, US
Andrew Thomas Waddell - Portola Valley CA, US
Adam James Bovill - San Francisco CA, US
Yujie Lin - Sunnyvale CA, US
Pawan Singh - Sunnyvale CA, US

Assignee:

The Fanfare Group, Inc. - Mountain View CA

International Classification:

G06F 7/06
G06F 17/21
G06F 17/30

US Classification:

707 4, 715235, 707E17062

Abstract:

A response map descriptively modeling the textual format of a test response of a system verification test is created without a priori understanding of the format of the given response. Such response map is applied to the test response or other similar test responses that share the same format. More specifically, a method of identifying and extracting one or more formats of textual data included in test responses from system verification testing of a system under test is provided, by receiving a first test response including first textual data in one or more formats, generating a response map descriptively modeling the first test response without a priori information of the one or more formats, and applying the response map to a second test response to identify and extract second textual data from the second test response. The second textual data is also in the one or more formats.