Brandon S Scott

US Patent:

20220276481, Sep 1, 2022

Filed:

May 16, 2022

Appl. No.:

17/663599

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
John Cruickshank - Brooklyn NY, US
Julie Orlando - Akron OH, US
Adele Frankel - New York NY, US
Brandon Scott - New York NY, US

Assignee:

Nanotronics Imaging, Inc. - Cuyahoga Falls OH

International Classification:

G02B 21/36
G02B 21/00
G06T 7/73
G06V 10/20
G06V 20/69

Abstract:

A method and system for mapping fluid objects on a substrate using a microscope inspection system that includes a light source, imaging device, stage for moving a substrate disposed on the stage, and a control module. A computer analysis system includes an object identification module that identifies for each of the objects on the substrate, an object position on the substrate including a set of X, Y, and θ coordinates using algorithms, networks, machines and systems including artificial intelligence and image processing algorithms. At least one of the objects is fluid and has shifted from a prior position or deformed from a prior size.

US Patent:

20210278172, Sep 9, 2021

Filed:

Feb 16, 2021

Appl. No.:

17/177191

Inventors:

- Highland UT, US
Brandon R. Scott - American Fork UT, US

International Classification:

F41C 33/04

Abstract:

An insert for a collapsible firearm receptacle of a concealed carry holster includes a body that may fit snugly into the collapsible firearm receptacle. The insert may also hold the collapsible firearm receptacle in a somewhat open arrangement to facilitate the ready insertion of a barrel of a firearm into the collapsible firearm receptacle and removal of the barrel of the firearm from the collapsible firearm receptacle. The insert may include an outer wall, a front wall, and a rear wall that define an interior of the insert. The insert may also include a lip that protrudes outwardly to extend beyond an upper edge of the collapsible firearm receptacle. Concealed carry holsters that include the insert are also disclosed, as are methods of using the insert and concealed carry holsters that include the insert.

US Patent:

20210026125, Jan 28, 2021

Filed:

Oct 8, 2020

Appl. No.:

17/066012

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
John Cruickshank - Brooklyn NY, US
Julie Orlando - Akron OH, US
Adele Frankel - New York NY, US
Brandon Scott - New York NY, US

Assignee:

Nanotronics Imaging, Inc. - Cuyahoga Falls OH

International Classification:

G02B 21/36
G02B 21/00
G06T 7/73
G06K 9/32

Abstract:

A method and system for mapping fluid objects on a. substrate using a microscope inspection system that includes a light source, imaging device, stage for moving a substrate disposed on the stage, and a control module. A computer analysis system includes an object identification module that identifies for each of the objects on the substrate, an object position on the substrate including a set of X, Y, and θ coordinates using algorithms, networks, machines and systems including artificial intelligence and image processing algorithms. At least one of the objects is fluid and has shifted from a prior position or deformed from a prior size.

US Patent:

20200326519, Oct 15, 2020

Filed:

Jun 29, 2020

Appl. No.:

16/915057

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
Brandon Scott - New York NY, US
Dylan Fashbaugh - Monmouth Junction NJ, US

International Classification:

G02B 21/00
G02B 21/36
G06K 9/00
H04N 1/387
G02B 21/26

Abstract:

A microscope system and method allow for a desired x′-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x′-direction. The angle of offset of the x′-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x′-direction without a substantial shift of the image sensor relative to the specimen in a y′-direction, the y′-direction being orthogonal to the x′ direction of the specimen. The movement is based on the angle of offset.

US Patent:

20200124837, Apr 23, 2020

Filed:

Sep 26, 2019

Appl. No.:

16/583925

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
John Cruickshank - Brooklyn NY, US
Julie Orlando - Akron OH, US
Adele Frankel - New York NY, US
Brandon Scott - New York NY, US

International Classification:

G02B 21/36
G02B 21/00
G06T 7/73
G06K 9/32

Abstract:

A method and system for mapping fluid objects on a substrate using a microscope inspection system that includes a light source, imaging device, stage for moving a substrate disposed on the stage, and a control module. A computer analysis system includes an object identification module that identifies for each of the objects on the substrate, an object position on the substrate including a set of X, Y, and θ coordinates using algorithms, networks, machines and systems including artificial intelligence and image processing algorithms. At least one of the objects is fluid and has shifted from a prior position or deformed from a prior size.

US Patent:

20180335614, Nov 22, 2018

Filed:

Jun 29, 2018

Appl. No.:

16/023219

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
Brandon Scott - New York NY, US
Dylan Fashbaugh - Monmouth Junction NJ, US

International Classification:

G02B 21/00
H04N 1/387
G06K 9/00
G02B 21/26
G02B 21/36
G06K 9/20

Abstract:

A microscope system and method allow for a desired x′-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x′-direction. The angle of offset of the x′-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x′-direction without a substantial shift of the image sensor relative to the specimen in a y′-direction, the y′-direction being orthogonal to the x′ direction of the specimen. The movement is based on the angle of offset.

US Patent:

20180307016, Oct 25, 2018

Filed:

Jun 29, 2018

Appl. No.:

16/023308

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
Brandon Scott - New York NY, US
Dylan Fashbaugh - Monmouth Junction NJ, US

International Classification:

G02B 21/00
H04N 1/387
G02B 21/36
G06K 9/00
G06K 9/20

Abstract:

A microscope system and method allow for a desired x′-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x′-direction. The angle of offset of the x′-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x′-direction without a substantial shift of the image sensor relative to the specimen in a y′-direction, the y′-direction being orthogonal to the x′ direction of the specimen. The movement is based on the angle of offset.

US Patent:

20180231752, Aug 16, 2018

Filed:

May 16, 2017

Appl. No.:

15/596352

Inventors:

- Cuyahoga Falls OH, US
John B. Putman - Celebration FL, US
Brandon Scott - New York NY, US
Dylan Fashbaugh - Monmouth Junction NJ, US

International Classification:

G02B 21/00
G02B 21/36
G06K 9/00
H04N 1/387

Abstract:

A microscope system and method allow for a desired x′-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x′-direction. The angle of offset of the x′-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x′-direction without a substantial shift of the image sensor relative to the specimen in a y′-direction, the y′-direction being orthogonal to the x′ direction of the specimen. The movement is based on the angle of offset.