Curtis B Miller

US Patent:

7148716, Dec 12, 2006

Filed:

Jun 10, 2004

Appl. No.:

10/864976

Inventors:

Glenn E. Schuette - Allen TX, US
James E. Rousey - Lucas TX, US
Curtis E. Miller - Wylie TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G01R 31/26
G01R 31/02

US Classification:

324765, 324764, 324754

Abstract:

According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set associated with the wafer is useable and generating a probe map of the wafer from the data set. The probe map identifies a physical position associated with each unprobed die supported on the surface of the wafer. The probe map and one or more probe commands are communicated to a probe module to drive the probe module in resuming the probe of the wafer.

US Patent:

7323899, Jan 29, 2008

Filed:

Oct 19, 2006

Appl. No.:

11/551097

Inventors:

Glenn E Schuette - Allen TX, US
James E Rousey - Lucas TX, US
Curtis E Miller - Wylie TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G01R 31/26
G01R 31/02

US Classification:

324765, 324754, 324764

Abstract:

According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set associated with the wafer is useable and generating a probe map of the wafer from the data set. The probe map identifies a physical position associated with each unprobed die supported on the surface of the wafer. The probe map and one or more probe commands are communicated to a probe module to drive the probe module in resuming the probe of the wafer.

US Patent:

7853640, Dec 14, 2010

Filed:

Sep 7, 2004

Appl. No.:

10/935811

Inventors:

Glenn E. Schuette - Allen TX, US
Edward J. Russell - Plano TX, US
Curtis E. Miller - Wylie TX, US
Xinqun Zeng - Plano TX, US

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G06F 15/16
G06F 9/44

US Classification:

709202, 717172

Abstract:

The distribution of Bluetooth IDs among multiple integrated circuit testers at multiple sites for programming with a master database containing large size ID blocks, site operational databases with medium size ID blocks and tester programs with small size ID blocks provides reduced memory requirements and limits the chance of two units with a duplicate ID.