Wayne R. Jones - Alderwood Manor WA Daniel J. Voss - Seattle WA
Assignee:
John Fluke Mfg. Co., Inc. - Everett WA
International Classification:
G01R 104 G01R 106
US Classification:
324158F
Abstract:
In a system for troubleshooting a unit containing microprocessor-based digital circuitry including a bus, wherein the system includes a digital test apparatus that emulates the microprocessor of the unit to test components on the bus and a device for interfacing signals between the test apparatus and the microprocessor comprises a clip that mounts to the microprocessor in electrical contact with the microprocessor leads. The clip preferably is of a type adapted to attach resiliently to the leads of all four sides of a soldered-in microprocessor in a leaded chip carrier housing. A connector to couple the clip to the test apparatus through a wire harness is mounted on a printed circuit board carrying pins corresponding to the lines of the microprocessor bus and the clip, and cables extending from the circuit board to the clip are coupled to the pins of the circuit board and clip by push connectors. A rod interconnecting the clip and the circuit board maintains the distance between the clip and circuit board fixed to prevent the push connectors from "backing off" the pins as the clip is manually operated. A pair of "flying leads", extending from the circuit board, carries probes that clip to terminals of the unit under test.
Dr. Voss graduated from the University of Texas Medical Branch at Galveston in 1985. He works in Georgetown, TX and specializes in Family Medicine. Dr. Voss is affiliated with Saint Davids Medical Center, Seton Medical Center Williamson and St Davids Georgetown Hospital.
Construction Law and Litigation Mechanic's Lien Foreclosure Mortgage Foreclosure Commercial Litigation Mediation Appeals Defective and Dangerous Products Arbitration
Varolii since Apr 2008
Sr. QA Engineer
Varia Mobile Jun 2002 - Jan 2008
Software QA Engineer
AOL 2005 - 2007
QA Software Engineer
Saltmine Apr 2000 - Mar 2002
Software Test Engineer
Microsoft (contracted through Volt) Oct 1998 - Feb 2000
Software Test Engineer
Education:
University of Washington
MSEE, MBA, electronics, bioengineering, finance
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