Eduardo F Veiga

US Patent:

6587291, Jul 1, 2003

Filed:

May 7, 2001

Appl. No.:

09/850610

Inventors:

Ara Patapoutian - Westborough MA
Peter McEwen - Santa Clara CA
Eduardo Veiga - Sunnyvale CA
Bruce D. Buch - Westboro MA

Assignee:

Maxtor Corporation - Longmont CO

International Classification:

G11B 509

US Classification:

360 32, 360 51, 360 42, 360 7708, 360 7814, 360 49, 341 70, 375361, 375370

Abstract:

Sampling data with wide bi-phase code symbols includes sampling a wide bi-phase code symbol in the data a number (N) of times to produce samples of data, selecting a subset of the samples, determining which sample in the subset of samples has a largest magnitude, and selecting a subset of samples in a subsequent wide bi-phase code symbol based on a sample in a previous subset that has the largest magnitude.