Frederick Brumble from Spokane, WA

Memory And Apparatus For A Thermally Accelerated Reliability Testing
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US Patent:

52784959, Jan 11, 1994
Filed:

Jun 29, 1993
Appl. No.:

8/084789
Inventors:

Bradford P. Beaton - West Columbia SC
Michael C. Rankin - West Columbia SC
Frederick D. Brumble - Columbia SC
Assignee:

NCR Corporation - Dayton OH
International Classification:

G01R 3102
H01L 2344
US Classification:

324158F
Abstract:

A method for rapidly changing temperatures of either an unpopulated printed circuit board or a completed printed circuit board assembly and testing operation thereof. The rapid temperature change nondestructively stresses the printed circuit board or assembly and uncovers many defects that are hard to discover by constant temperature test methods. Each unit under test is alternately bathed with cold perfluorinated liquid and hot perflourinated liquid to rapidly change it temperature from cold (273 degrees kelvin) to hot (333 degrees kelvin).