Hui Chang Yu

US Patent:

20150194956, Jul 9, 2015

Filed:

Jan 7, 2014

Appl. No.:

14/149720

Inventors:

- Tokyo, JP
Hui Yu - San Jose CA, US
Keith Schaub - Austin TX, US
Liang Ge - San Jose CA, US
Frank Goh - San Jose CA, US

Assignee:

Advantest Corporation - Tokyo

International Classification:

H03K 19/00
G01R 31/28

Abstract:

In a testing device, a method for implementing automatic RF port testing. The method includes attaching a device under test having a plurality of RF pins to a load board, dynamically tuning a plurality of RF ports of the load board to the plurality of RF pins, and automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance. The method further includes implementing an RF port testing process on the device under test.

US Patent:

20140344627, Nov 20, 2014

Filed:

May 15, 2014

Appl. No.:

14/279178

Inventors:

- Tokyo, JP
Hui YU - San Jose CA, US
Minh DIEP - San Jose CA, US

International Classification:

G06F 11/26
G06F 3/0488

US Classification:

714 46

Abstract:

System and method of systems and methods of controlling an IC test equipment in response to verbal commands issued by test equipment users. A control apparatus according to the present disclosure includes a speech detection device operable to detect verbal commands and test control software configured to control operations of the test equipment. The control software is added with verbal command recognition capabilities. Program action commands defined in the test control software are associated with respective recognizable verbal commands. Upon a recognizable verbal command is detected, it is interpreted into the corresponding program action command which triggers the intended test program actions. The control apparatus may also have a gesture detection device, through which user gesture commands can be detected and interpreted into corresponding program actions commands.