Julie C Campbell

US Patent:

6462529, Oct 8, 2002

Filed:

Jul 31, 2000

Appl. No.:

09/629016

Inventors:

Julie A. Campbell - Beaverton OR

Assignee:

LeCroy Corporation - Beaverton OR

International Classification:

G01R 3102

US Classification:

324 725, 324754

Abstract:

A support device hands-free operation of an electrical test probe having a tip preferably includes at least one support member and an adapter. The adapter is for connecting the support members to the electrical test probe. The support members and the tip of the electrical test probe together form a âtripodâ to support the electrical test probe for hands-free operation. The adapter may be an interchangeable connector that may be removed from the support members, a leg integral connector that is permanently attached to the support members, an adaptable connector that is coupleable with different types of probing heads, or an attachment connector that uses an attachment mechanism to attach the probing head to the support members.

US Patent:

6518780, Feb 11, 2003

Filed:

Jul 31, 2000

Appl. No.:

09/629017

Inventors:

Julie A. Campbell - Beaverton OR
Christina Colby Barsotti - Vancouver WA

Assignee:

LeCroy Corporation - Beaverton OR

International Classification:

G01R 3102

US Classification:

324754, 324 725

Abstract:

An electrical test probe wedge tip according to the present invention includes an electrically conductive interior optionally surrounded, at least partially, by an electrically insulated exterior surface. A longitudinal axis extends the length of the electrical test probe tip. In one preferred embodiment the top tip end has a single planar surface at an angle to the longitudinal axis. A method of fabricating an electrical test probe tip includes providing an elongate electrically conductive blank coated with insulation. An angled surface is exposed by removing a portion of the first end along a plane at an angle to the longitudinal axis of the blank.

US Patent:

6538424, Mar 25, 2003

Filed:

Jul 31, 2000

Appl. No.:

09/629018

Inventors:

Julie A. Campbell - Beaverton OR

Assignee:

Le Croy Corporation - Beaverton OR

International Classification:

G01R 106

US Classification:

324149, 324 725, 324133

Abstract:

An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects. A preferred embodiment of the notched electrical test probe tip of the present invention has a probing tip with a longitudinal planar axis. Two planar contact surfaces substantially form an inverted âVâ from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating. This configuration can be constructed by starting with an elongate electrically conductive blank and drilling an at least partial central bore substantially parallel to the longitudinal planar axis. Then two planar cuts are made removing a portion of the blank to expose the contact surfaces.

US Patent:

6605934, Aug 12, 2003

Filed:

Jul 31, 2000

Appl. No.:

09/629258

Inventors:

Julie A. Campbell - Beaverton OR
Stephen Mark Sekel - Camas WA
Stanley Joseph Sula - Portland OR

Assignee:

LeCroy Corporation - Beaverton OR

International Classification:

G01R 3102

US Classification:

324 725, 324149, 324754, 439482

Abstract:

A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. An electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip.

US Patent:

6650131, Nov 18, 2003

Filed:

Feb 10, 2003

Appl. No.:

10/364023

Inventors:

Julie A. Campbell - Beaverton OR
Christina Colby Barsotti - Vancouver WA

Assignee:

LeCroy Corporation - Chestnut Ridge NY

International Classification:

G01R 3102

US Classification:

324754, 324 725

Abstract:

An electrical test probe tip of the present invention has a longitudinal axis extending from a first end to a second end and an electrically conductive interior extending substantially therebetween. A conductive exterior-most surface at least partially surrounds the electrically conductive interior. The test probe tip has a maximum length measured from the first end to the second end and has a minimum length measured from the first end to the second end. An electrically insulated surface at the first end substantially descends from the maximum length to the minimum length. The electrical test probe tip may be inserted between a target IC pin and the electrically insulated surface faces the adjacent IC pin.

US Patent:

6809535, Oct 26, 2004

Filed:

Feb 10, 2003

Appl. No.:

10/364017

Inventors:

Julie A. Campbell - Beaverton OR

Assignee:

LeCroy Corporation - Chestnut Ridge NY

International Classification:

G01R 3102

US Classification:

324754, 324149, 324 725

Abstract:

An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects preferably is a probing tip with a longitudinal planar axis and two planar contact surfaces. The contact surfaces substantially form an inverted âVâ from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating.

US Patent:

6828769, Dec 7, 2004

Filed:

Jun 27, 2003

Appl. No.:

10/607791

Inventors:

Julie A. Campbell - Beaverton OR
Stephen Mark Sekel - Camas WA
Stanley Joseph Sula - Portland OR

Assignee:

LeCroy Corporation - Chestnut Ridge NY

International Classification:

G01R 3102

US Classification:

324 725, 324149, 324754, 439482

Abstract:

A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. A minimally inductive electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip. In one preferred embodiment the probing tip cartridge further includes at least one foot.

US Patent:

6863576, Mar 8, 2005

Filed:

Dec 13, 2001

Appl. No.:

10/020707

Inventors:

Julie A. Campbell - Beaverton OR, US
Lawrence W. Jacobs - Beaverton OR, US

Assignee:

LeCroy Corporation - Chestnut Ridge NY

International Classification:

H01R013/24

US Classification:

439700, 439824

Abstract:

An electrical test probe tip, comprising a conductive flexible coil having a first end and a second end. The first end is for flexibly coupling with a device to be probed. The second end is attached to a connector. The connector may be an integral connection with a probing head or may be a connecting pin. Multiple test probe spring tips may be used to simultaneously probe signal and ground reference points. The present invention is also directed to a method for using the flexible spring tip.