Li Lin

US Patent:

6520004, Feb 18, 2003

Filed:

Aug 3, 2000

Appl. No.:

09/601664

Inventors:

Li Lin - Wallingford PA

Assignee:

E. I. du Pont de Nemours and Company - Wilmington DE

International Classification:

G01N 346

US Classification:

73 81, 73 7

Abstract:

This invention concerns a test apparatus and procedure used for quantitative and qualitative characterization of scratch and mar behavior of films or coatings, more particularly automotive coatings. The apparatus includes a micro-indentor that penetrates and scratches the coating to be characterized together with interrelated components for measuring the force applied, the length and depth of the indentor penetration, the geometry of the disturbed coating surface as well as a system for measuring, analyzing and comparing test results.

US Patent:

7395722, Jul 8, 2008

Filed:

Nov 21, 2006

Appl. No.:

11/602522

Inventors:

Li Lin - Wallingford PA, US

Assignee:

E.I. du Pont de Nemours and Company - Wilmington DE

International Classification:

G01D 1/16

US Classification:

73789, 73790, 73791, 73795

Abstract:

This invention is directed to the measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width. This invention is further directed to the measurement of stress-strain relationships in thin films at controlled temperatures and at high strain rates above 100% per second.

US Patent:

8434377, May 7, 2013

Filed:

Jun 30, 2008

Appl. No.:

12/663918

Inventors:

Li Lin - Wallingford PA, US
James Lamonte Adams - Glenside PA, US

Assignee:

U.S. Coatings IP Co. LLC - Wilmington DE

International Classification:

G01N 33/00
G01N 3/56

US Classification:

73866, 73 7

Abstract:

The present invention is directed to a method for measuring sandability of a coating or an article. This invention is particularly directed to a method for measuring sandability of a coating or an article quantitatively by measuring weight loss of said coating or article after being sanded. This invention is also directed to a system for measuring sandability of a coating or an article using said method.

US Patent:

20130064614, Mar 14, 2013

Filed:

Jun 29, 2010

Appl. No.:

13/698999

Inventors:

Li Lin - Wallingford PA, US
Shi Hua Zhang - Wilmington DE, US

International Classification:

B23B 39/08

US Classification:

408 8

Abstract:

The present disclosure is directed to a device for producing standardized assay areas on conductive substrates coated with organic coating layers. The device can be used to produce standardized assay areas for corrosion evaluation tests at an accelerated rate.

US Patent:

20130064615, Mar 14, 2013

Filed:

Jun 29, 2010

Appl. No.:

13/699006

Inventors:

Li Lin - Wallingford PA, US
Shi Hua Zhang - Wilmington DE, US

Assignee:

E I DuPont De Nemours and Company - Wilmington DE

International Classification:

B23B 39/04

US Classification:

408 8

Abstract:

The present disclosure is directed to a portable device for producing standardized assay areas on conductive substrates coated with organic coating layers. The present disclosure is directed to a process for producing standardized assay areas using the portable device. The portable device and the process can be used to produce assay areas for corrosion evaluation tests at an accelerated rate. The portable device and the process are particularly useful for producing standardized assay areas on large or immobile structures or objects.

US Patent:

20130064617, Mar 14, 2013

Filed:

Jun 29, 2010

Appl. No.:

13/699002

Inventors:

Shi Hua Zhang - Wilmington DE, US
Li Lin - Wallingford PA, US

Assignee:

E I Du Pont de Nemours and Company - Wilmington DE

International Classification:

B23B 47/28

US Classification:

408 1 R

Abstract:

The present disclosure is directed to a process for producing standardized assay areas on conductive substrates coated with organic coating layers. The process can be used to produce standardized assay areas for corrosion evaluation tests at an accelerated rate.

US Patent:

55178600, May 21, 1996

Filed:

Feb 3, 1995

Appl. No.:

8/382815

Inventors:

Li Lin - Wallingford PA
Melvin H. Johnson - Chadds Ford PA

Assignee:

E. I. Du Pont de Nemours and Company - Wilmington DE

International Classification:

G01D 116

US Classification:

73789

Abstract:

Measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width.

US Patent:

20150145531, May 28, 2015

Filed:

Nov 26, 2013

Appl. No.:

14/090333

Inventors:

Li LIN - WIlmington DE, US

International Classification:

G01B 7/14
G01R 27/26

US Classification:

324662

Abstract:

A system for obtaining incremental and absolute displacement measurements using systems of electrodes that interact to form variable capacitors and systems that facilitate implementation of the method along with exemplary embodiments of these systems. The capacitors created by the disclosed method have known physical properties and corresponding known mathematical relationships. These laws are exploited in such a way by our method as to overcome inadequacies in existing systems and create superior systems. These superior systems improve upon the existing art by including economically and reliably made sensors based on the area varying principle which eliminate dead zone issues and increase accuracy through a reduction of the influence of gap variations on capacitive systems through the use of compensatory geometrical arrangements of multiple capacitive systems.