Muhammad N Ahmed

US Patent:

20220390936, Dec 8, 2022

Filed:

Oct 29, 2020

Appl. No.:

17/755641

Inventors:

- Tarrytown NY, US
Muhammad Ahmed - Yonkers NY, US

Assignee:

Siemens Healthcare Diagnostics Inc. - Tarrytown NY

International Classification:

G05B 23/02
G06V 20/69
G16H 30/40
G16H 40/67

Abstract:

A method of analyzing a specimen includes detecting a specimen integrity error in the specimen; capturing an image of the specimen; sending the image of the specimen to a customer support center at a remote location; analyzing the image of the specimen at the customer support center; and determining a cause of the specimen integrity error in response to analyzing the image of the specimen. Diagnostic analyzers and diagnostic systems are also disclosed.

US Patent:

20230009309, Jan 12, 2023

Filed:

Dec 11, 2020

Appl. No.:

17/757379

Inventors:

- Tarrytown NY, US
Muhammad Ahmed - Yonkers NY, US

Assignee:

Siemens Healthcare Diagnostics Inc. - Tarrytown NY

International Classification:

G01N 35/00
G01N 35/10

Abstract:

A quality control method for a diagnostic analyzer includes performing a quality control test or a plurality of specimen tests; determining, with a controller, that a result of the quality control test or a plurality of specimen test results is outside of a threshold; monitoring one or more mechanical devices of the diagnostic analyzer with the controller; receiving, by the controller, an error code indicating an error in a mechanical device of the one or more mechanical devices; and initiating a calibration procedure in response to the result of the quality control test or the plurality of specimen test results being outside of the threshold and receiving the error code. Other apparatus and methods are disclosed.