Peter J Codella

US Patent:

6355723, Mar 12, 2002

Filed:

Jun 22, 2000

Appl. No.:

09/599659

Inventors:

Harry van Baal - Goes, NL
Jenny Z. Bu - Newburgh IN
Peter J. Codella - Niskayuna NY
Robert R. Gallucci - Mt. Vernon IN
Dennis A. Kopp - Newburg IN
Martin J. Lindway - Newburgh IN
James R. Wilson - Troy MI

Assignee:

General Electric Co. - Pittsfield PA

International Classification:

C08L 7700

US Classification:

524602

Abstract:

A molded article suitable for direct application of a reflective metal coating includes an amorphous thermoplastic or thermoplastic blend having a glass transition temperature greater than about 170Â C. and at least one thermally stable colorant that contributes to the articles dark appearance. The article has excellent dimensional stability, and the surface to which a metal coating can be applied exhibits low gloss. Application of a metal coating to the molded article produces a metalized surface with high total reflectivity, low diffuse reflectivity, and low haze. Compositions and methods for forming the article are described.

US Patent:

7394545, Jul 1, 2008

Filed:

Jul 11, 2005

Appl. No.:

11/178846

Inventors:

Andre Vanhove - Beveren, BE
Brian W. Lasiuk - Spring TX, US
Peter J. Codella - Niskayuna NY, US
Wiley Lyle Parker - Conroe TX, US

Assignee:

GE Betz, Inc. - Trevose PA

International Classification:

G01N 21/00

US Classification:

356441

Abstract:

A system and method for counting opaque particles within a fluid sample. The system uses an optical lens system to focus a light beam onto a sample on a multi-dimensional translation stage. The translation stage is moved in a pattern such that the intensity of the transmitted light is measured as a function of path length. A photo detector is used to measure the transmitted light through the sample. An analog-to-digital converter quantifies the transmitted light intensity. Changes in light intensity along the path length are correlated with the detection of an opaque particle. Data processing algorithms are implemented to automatically determine the background noise level associated with the acquired data and to set a discriminator level above which a particle is registered. The total number of particles and an areal density is reported along with an estimate of the uncertainty.

US Patent:

7595882, Sep 29, 2009

Filed:

Apr 14, 2008

Appl. No.:

12/102079

Inventors:

Rui Chen - Clifton Park NY, US
Marko Klaus Baller - Saarbrücken, DE
Peter Joseph Codella - Niskayuna NY, US
Anis Zribi - Rexford NY, US
Renato Guida - Wynantskill NY, US
Alexey Vasily Vert - Schenectady NY, US
Radislav Alexandrovich Potyrailo - Niskayuna NY, US
Xiaoyong Liu - Malden MA, US
Zhiyong Wang - Clifton Park NY, US

Assignee:

Geneal Electric Company - Niskayuna NY

International Classification:

G01N 21/00

US Classification:

356437, 356301

Abstract:

Embodiments of the invention include a system for sensing homonuclear diatomic molecules, such as, for example, nitrogen. Other embodiments include a method for sensing homonuclear diatomic molecules. The system may include a light source, a hollow-core wave-guiding device that exhibits a low attenuation at predetermined operating optical frequencies and is in optical communication with the light source, a gas introduction system for introducing a gaseous medium between the light source and the hollow-core wave-guiding device, and a detector in optical communication with the hollow-core wave-guiding device.

US Patent:

7627357, Dec 1, 2009

Filed:

Jun 30, 2005

Appl. No.:

11/172648

Inventors:

Anis Zribi - Rexford NY, US
Peter Joseph Codella - Niskayuna NY, US
Min-Yi Shih - Niskayuna NY, US
Ganesh Chandan Gangadharan - Bangalore, IN
Rui Chen - Niskayuna NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

A61B 5/1455

US Classification:

600319, 600310

Abstract:

A method for determining analyte concentration levels is provided. The method includes acquiring radiation scattered off or transmitted by a target, analyzing at least a first portion of the radiation via a first technique to generate a first measurement of analyte concentration levels, and analyzing at least a second portion of the radiation via a second technique to generate a second measurement of analyte concentration levels. The method further determines analyte concentration levels based on at least one of the first measurement or the second measurement. In addition, a system for implementing the method and a probe for measuring and monitoring the analyte concentration levels is provided.

US Patent:

7652586, Jan 26, 2010

Filed:

Aug 15, 2006

Appl. No.:

11/504739

Inventors:

Marko Baller - Bavaria, DE
Marcin Alexy - Bavaria, DE
Glenn S. Claydon - Wynantskill NY, US
Peter Joseph Codella - Niskayuna NY, US
Stacey Kennerly - Niskayuna NY, US
Kuna Kishore - Bangalore, IN
Anis Zribi - Rexford NY, US
Guiju Song - Shanghai, CN
Shivappa Goravar - Karnataka, IN
Ajit Achuthan - Schenectady NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G08B 21/00
G01R 27/26
G01F 1/68
B60H 1/00
G05D 23/00

US Classification:

340635, 340602, 340604, 324663, 7320426, 165 111, 236 94

Abstract:

According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e. g. , a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.

US Patent:

20040237888, Dec 2, 2004

Filed:

May 30, 2003

Appl. No.:

10/449975

Inventors:

Peter Codella - Niskayuna NY, US
Manisha Tinani - Albany NY, US
George Dalakos - Niskayuna NY, US
Eric Breitung - Albany NY, US

Assignee:

General Electric Company

International Classification:

C23C016/00
C23F001/00

US Classification:

118/712000, 427/569000, 156/345240

Abstract:

An optical monitoring system for a plasma enhanced chemical vapor deposition (PECVD) apparatus includes a light source for generating an input light beam, and a first port configured within the PECVD apparatus for receiving the input light beam from the light source. The first port is configured to direct the input beam upon a workpiece within the PECVD apparatus. A second port is configured within the PECVD apparatus for receiving an output light beam passed through the workpiece, and a comparing mechanism for comparing the output light beam with the input light beam is configured to determine a deposited layer thickness upon the workpiece.

US Patent:

20050022735, Feb 3, 2005

Filed:

Jul 31, 2003

Appl. No.:

10/630139

Inventors:

Eric Breitung - Albany NY, US
George Dalakos - Niskayuna NY, US
Peter Codella - Niskayuna NY, US

International Classification:

C23C016/00
C23F001/00

US Classification:

118715000

Abstract:

Gas delivery devices for PECVD systems and methods for using such systems are described. The delivery device goes directly through the powered electrode and thereby bypasses components of the PECVD systems used to support that electrode. The delivery device contains a coupling device between the powered electrode of the PECVD reactor and the gas inlet line. The gas inlet line is electrically and thermally isolated from the powered electrode and is sealed to maintain the vacuum integrity of the PECVD reactor through the use of a coupling device. Thus, gases from the heated gas lines can be routed directly through the powered electrode and fed into the reactor via the showerhead without having a cold area between the showerhead and gas inlet line.

US Patent:

20100007876, Jan 14, 2010

Filed:

Sep 18, 2009

Appl. No.:

12/562443

Inventors:

Rui Chen - Clifton Park NY, US
Marko Klaus Baller - Saarbrucken, DE
Peter Joseph Codella - Niskayuna NY, US
Anis Zribi - Rexford NY, US
Renato Guida - Wynanskill NY, US
Alexey Vasily Vert - Schenectady NY, US
Radislav Alexandrovich Potyrailo - Niskayuna NY, US
Xiaoyong Liu - Malden MA, US
Zhiyong Wang - Clifton Park NY, US

Assignee:

GENERAL ELECTRIC COMPANY - Schenectady NY

International Classification:

G01J 3/44
G01N 21/00

US Classification:

356301, 356437

Abstract:

Embodiments of the invention include a method for sensing. Other embodiments include a method for sensing molecules, for example, homonuclear diatomic molecules. The method may include transmitting light from a light source through a hollow-core wave-guiding device that exhibits a low attenuation at predetermined operating optical frequencies; introducing a gaseous medium between the light source and the hollow-core wave-guiding device; and detecting molecules within the gas.