Arjun Selvakumar - Bellaire TX, US Howard D. Goldberg - Sugar Land TX, US Duli Yu - Sugar Land TX, US Matthew Ip - Austin TX, US Martin A. Schmidt - Reading MA, US James L. Marsh - San Antonio TX, US Philip Simon - Houston TX, US
Assignee:
Input/Output, Inc. - Stafford TX
International Classification:
G01P015/00
US Classification:
7351418, 7351423
Abstract:
An accelerometer () for measuring seismic data. The accelerometer () includes an integrated vent hole for use during a vacuum sealing process and a balanced metal pattern for reducing cap wafer bowing. The accelerometer () also includes a top cap press frame recess () and a bottom cap press frame recess () for isolating bonding pressures to specified regions of the accelerometer (). The accelerometer () is vacuum-sealed and includes a balanced metal pattern () to prevent degradation of the performance of the accelerometer (). A dicing process is performed on the accelerometer () to isolate the electrical leads of the accelerometer (). The accelerometer () further includes overshock protection bumpers () and patterned metal electrodes to reduce stiction during the operation of the accelerometer ().
Arjun Selvakumar - Bellaire TX, US Howard D. Goldberg - Sugar Land TX, US Duli Yu - Sugar Land TX, US Matthew Ip - Austin TX, US Martin A. Schmidt - Reading MA, US James L. Marsh - San Antonio TX, US Philip Simon - Houston TX, US
Assignee:
Input/Output, Inc. - Stafford TX
International Classification:
G01P015/00 H01L021/76
US Classification:
7351416, 7351424, 438 15
Abstract:
An accelerometer () for measuring seismic data. The accelerometer () includes an integrated vent hole for use during a vacuum sealing process and a balanced metal pattern for reducing cap wafer bowing. The accelerometer () also includes a top cap press frame recess () and a bottom cap press frame recess () for isolating bonding pressures to specified regions of the accelerometer (). The accelerometer () is vacuum-sealed and includes a balanced metal pattern () to prevent degradation of the performance of the accelerometer (). A dicing process is performed on the accelerometer () to isolate the electrical leads of the accelerometer (). The accelerometer () further includes overshock protection bumpers () and patterned metal electrodes to reduce stiction during the operation of the accelerometer ().
Arjun Selvakumar - Bellaire TX, US Howard D. Goldberg - Sugar Land TX, US Duli Yu - Sugar Land TX, US Matthew Ip - Austin TX, US Martin A. Schmidt - Reading MA, US James L. Marsh - San Antonio TX, US Philip Simon - Houston TX, US
Assignee:
Input/Output, Inc. - Houston TX
International Classification:
H01L 29/84 H01L 21/00
US Classification:
257415, 438 48
Abstract:
An accelerometer () for measuring seismic data. The accelerometer () includes an integrated vent hole for use during a vacuum sealing process and a balanced metal pattern for reducing cap wafer bowing. The accelerometer () also includes a top cap press frame recess () and a bottom cap press frame recess () for isolating bonding pressures to specified regions of the accelerometer (). The accelerometer () is vacuum-sealed and includes a balanced metal pattern () to prevent degradation of the performance of the accelerometer (). A dicing process is performed on the accelerometer () to isolate the electrical leads of the accelerometer (). The accelerometer () further includes overshock protection bumpers () and patterned metal electrodes to reduce stiction during the operation of the accelerometer ().
RONALD B AZCARATE - BAGUIO CITY, PH PRIMITIVO A PALASI - BAGUIO CITY, PH PHILIP B SIMON - HOUSTON TX, US
International Classification:
H01L023/40 H01L023/36 H01L023/495
US Classification:
257/675000, 257/666000
Abstract:
A lead frame that does not tie straps and a die bond pad is rectangular in shape, with the same number of lead frame leads () on opposite sides and a different number of lead frame lead frame leads () on adjacent sides. Lead frame leads () extend into the area in which the tie strap would normally be placed. A heat slug is () taped into the lead frame to provide a semiconductor die mount area. At least one lead () from one side of the lead frame, located where the tie strap is normally located, is connected via a bond wire () to a bond pad () on the semiconductor die () on a side adjacent to the side where the lead frame lead is located.
Primitivo A. Palasi - Baguio, PH Ronaldo M. Arguelles - Baguio, PH Philip B. Simon - Houston TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
H01L 2334 H01L 2310
US Classification:
257712
Abstract:
A heat spreader (10) is provided for dissipating heat from a semiconductor die (32). The heat spreader (10) comprises a thermally conductive sheet (12) having an aperture (14) formed therein. At least one set of opposing members (20) extends inwardly, but do not contact, within the aperture (14). The opposing members (20) can receive adhesive material for securing the semiconductor die (32) to the heat spreader (10) such that the semiconductor die (32) is disposed over the aperture (14).
Monmouth County Academy of Allied Health & Science Neptune NJ 1997-2001
Community:
Keith Friedman, Griff Jones, Steven Filippo, Eric Lopez, Butter Pecan, Brian Quinn, Janine Ciccosanti, Phil Maida, Marielle Terzulli, Alina Bishop, Gerald Kosztur, Teara Debarros
Charles Dahlheimer, Jim Kuszaj, John Koenig, Thomas Wilder, Michael Kane, James Moll, Leon Kastel, Thomas Barron, Raymond Oge, Judy Evans, Thomas Richmeyer
Philip Simon (1997-2001), Jere Murdoch (1997-2001), Dave Ravi (1998-2002), Marsha Gilliam (1996-2000), Shana Careatti (1998-2002), Theressa LaBarrie (1998-2002)