Seung Won Shin

US Patent:

20170089858, Mar 30, 2017

Filed:

Sep 24, 2015

Appl. No.:

14/864400

Inventors:

- Mountain View CA, US
Hui Tian - Cupertino CA, US
Bill Maney - Emerald Hills CA, US
Seung Shin - San Jose CA, US

International Classification:

G01N 27/40
G01N 33/487

Abstract:

A system includes a circuit configured to detect a voltage corresponding to an electrical measurement of a nanopore. The system also includes a component configured to compare the voltage to another voltage. Based at least in part on the comparison, a one bit indicator is determined. The one bit indicator indicates whether the voltage indicates a change in a state of the nanopore. In the event it is determined that the voltage indicates the change in the state of the nanopore, a multiple bit signal is provided for output.