Anh Lan Hoang

US Patent:

6572265, Jun 3, 2003

Filed:

Apr 20, 2001

Appl. No.:

09/839857

Inventors:

John P. Gotthold - Sunnyvale CA
Anh N. Hoang - San Jose CA
Surinder S. Sandhu - Santa Clara CA
John Leonard Shaver - San Francisco CA
Terry M. Stapleton - San Jose CA

Assignee:

Luxtron Corporation - Santa Clara CA

International Classification:

G01J 508

US Classification:

374161, 374131, 374208, 385 12, 385147, 2504581, 2504591, 250234, 2505781

Abstract:

A temperature sensor utilizing optical temperature measuring techniques is constructed to make firm contact with a surface whose temperature is being measured, an example application being the monitoring of semiconductor wafers or flat panel displays while being processed. A cap is mounted near but spaced apart from an end of a lightwave guide, with a resilient element that applies force of the cap against a surface whose temperature is being measured as the cap is urged toward the optical fiber end. An optical temperature sensing element, such as luminescent material or a surface of known emissivity, is carried within the cap. A bellows with a closed end conveniently serves as both the cap and the resilient element. An alternative temperature measuring device installs an optical temperature sensing material within a test substrate behind an optical window, and then views the sensing material through the window.

US Patent:

7330333, Feb 12, 2008

Filed:

Jun 16, 2004

Appl. No.:

10/870789

Inventors:

Myeong Eop Kim - San Jose CA, US
Tho Pham - Milpitas CA, US
Anh Hoang - Santa Clara CA, US
Yun Sik Han - Cupertino CA, US

Assignee:

Samsung Electronics Co., Ltd. - Suwon

International Classification:

G11B 5/00

US Classification:

360 9701

Abstract:

A hard disk drive with a post that extends from a base of a base plate. The base has a slot adjacent to the post. The slot attenuates a shock wave that propagates through the base plate of the drive.

US Patent:

8593196, Nov 26, 2013

Filed:

Apr 30, 2012

Appl. No.:

13/459659

Inventors:

Ravi Karapatti Ramaswami - Cupertino CA, US
Vasu P. Ganti - Los Altos CA, US
Anh Hoang - Fremont CA, US

Assignee:

Apple Inc. - Cupertino CA

International Classification:

H03H 11/26

US Classification:

327276, 327279

Abstract:

A system and method for efficiently performing timing characterization of regions of an integrated circuit. An integrated circuit has monitors distributed in different physical regions across its die. Each monitor includes timing characterization and self-test circuitry. This circuitry includes one or more tunable delay lines used during timing measurements. The circuitry verifies the tunable delay lines are defect free prior to the timing measurements. If defects are detected, but tunable delay lines may still be used, a scaling factor may be generated for a failing tunable delay line. The scaling factor may be used during subsequent timing measurements to maintain a high accuracy for the measurements. The timing measurements may determine a particular physical region of the die provides fast or slow timing values. The resulting statistics of the timing measurements may be used to change an operational mode of the IC in at least the particular region.

US Patent:

20030206573, Nov 6, 2003

Filed:

May 30, 2003

Appl. No.:

10/452551

Inventors:

John Gotthold - Sunnyvale CA, US
Anh Hoang - San Jose CA, US
Surinder Sandhu - Santa Clara CA, US
John Shaver - San Francisco CA, US
Terry Stapleton - San Jose CA, US

International Classification:

G01J005/00

US Classification:

374/132000, 374/121000, 374/130000

Abstract:

A temperature sensor utilizing optical temperature measuring techniques is constructed to make firm contact with a surface whose temperature is being measured, an example application being the monitoring of semiconductor wafers or flat panel displays while being processed. A cap is mounted near but spaced apart from an end of a lightwave guide, with a resilient element that applies force of the cap against a surface whose temperature is being measured as the cap is urged toward the optical fiber end. An optical temperature sensing element, such as luminescent material or a surface of known emissivity, is carried within the cap. A bellows with a closed end conveniently serves as both the cap and the resilient element. An alternative temperature measuring device installs an optical temperature sensing material within a test substrate behind an optical window, and then views the sensing material through the window.

US Patent:

20070171958, Jul 26, 2007

Filed:

Jan 23, 2006

Appl. No.:

11/337641

Inventors:

Anh Hoang - San Jose CA, US
Terry Stapleton - San Jose CA, US

International Classification:

G01J 5/00
G01K 11/00

US Classification:

374161000, 374131000

Abstract:

A probe for use within a high voltage and high current electrical device is disclosed. The probe comprises an optical fiber, a substrate having a slot, and a photoluminescent material. The fiber has a first and second end and is configured to convey an activation light from the first to second end. A portion of the fiber is within the slot such that the slot receives the second end of the fiber. Emission of the photoluminescent material, as a function of temperature, is known. The photoluminescent material is disposed within at least a portion of the slot that faces the second end of the fiber so that they are in optical communication with each other. A change in intensity of a luminescent light emitted back into the fiber by the photoluminescent material when the activation light is conveyed by the fiber onto the photoluminescent material provides an indication of the integrity of the electrical device.

US Patent:

20080033300, Feb 7, 2008

Filed:

Aug 4, 2006

Appl. No.:

11/499530

Inventors:

Anh Hoang - San Jose CA, US
Ji-Dih Hu - San Jose CA, US

International Classification:

A61B 6/00
A61B 18/18

US Classification:

600474, 606 42, 606 12, 600549

Abstract:

Systems that measure temperatures of tissue during electrosurgery or laser therapy of the tissue or organs is provided. One system provides a pyrometer that measures infrared electromagnetic energy emitted by a surface of a tissue or organ thereby determining a sub-surface temperature of the tissue or organ. The system further has an energy generator and an ablation electrode or laser probe that delivers energy from the energy generator to a tissue or organ, responsive to a sub-surface temperature determined by the pyrometer. The pyrometer can be calibrated using a luminescent material having known optical properties as a function of temperature. The luminescent material can be positioned on the surface of the tissue or organ or inserted directly into the tissue or organ using a catheter. Methods in which the surface or sub-surface temperature of the tissue is measured during therapy are also provided.

US Patent:

20090164145, Jun 25, 2009

Filed:

Dec 19, 2007

Appl. No.:

12/004456

Inventors:

Ja Choon Koo - Seoul, KR
Anh Hoang - Santa Clara CA, US

International Classification:

G01L 1/00

US Classification:

702 41, 702 56

Abstract:

A test stand is disclosed for estimating the dynamics of a Fluid Dynamic Bearing (FDB) coupling a spindle motor to a rotating hub. The hub includes an air target and displacement plate. At least one air jet strikes the air target, and at least one displacement sensor engages the displacement plate to create a displacement reading. The displacement reading(s) are analyzed to estimate the dynamics of the FDB. The estimates may include but is not limited to the stiffness and/or damping of the FDB.

US Patent:

20130088254, Apr 11, 2013

Filed:

Apr 24, 2012

Appl. No.:

13/454830

Inventors:

Anh T. Hoang - Fremont CA, US
Brian S. Park - San Jose CA, US
Patrick D. McNamara - San Francisco CA, US

International Classification:

G01R 31/26

US Classification:

32476201

Abstract:

A system and method for testing circuits. A generated input voltage waveform for a first phase of a test may use transitions with a voltage swing between expected low and high trigger points for an integrated circuit (IC) with hysteresis. A generated input voltage waveform for a second phase of the test may use transitions with a voltage swing between the expected low trigger point and a high sub-threshold value. The high sub-threshold value may be a tolerable voltage difference below the expected high trigger point. A generated input voltage waveform for a third phase of the test may use transitions with a voltage swing between the expected high trigger point and a low sub-threshold value. The low sub-threshold value may be a tolerable voltage difference above the expected low trigger point. The expected trigger points and sub-threshold values may be found from earlier characterization studies for the IC.