Jun 2011 to Present Senior IT ManagerCisco San Jose, CA 2008 to Jul 2011 Project ManagerCisco San Jose, CA 2008 to Jul 2011 Project ManagerKeane Inc
2007 to 2008 Principal ConsultantAT&T San Ramon, CA 2006 to 2007 Program ManagerOn Command Corporation San Jose, CA 2000 to 2006 Member Technical Staff
Education:
Texas A&M University College Station, TX 1999 MS in BioEngineeringManipal Institute Of Technology 1996 BS in Biomedical Engineering
Skills:
IT Management Multisite Operations Quality Assurance Offshore Development ITIL Agile Development Project Management Change Control Board PMO Release Management Product Development Client/Vendor Relations
Robert Brainard - Sunnyvale CA, US Arvind Chari - Saratoga CA, US Alejandro de la Fuente Vornbrock - San Carlos CA, US Venkatesan Murali - San Jose CA, US Gopal Prabhu - San Jose CA, US Venkateswaran Subbaraman - San Jose CA, US Dong Xu - Fremont CA, US
Assignee:
GTAT Corporation - Nashua NH
International Classification:
H01L 21/00
US Classification:
438 66, 438 72, 257E31124
Abstract:
A free-standing metallic article, and method of making, is disclosed in which the metallic article is electroformed on an electrically conductive mandrel. The mandrel has an outer surface with a preformed pattern, wherein at least a portion of the metallic article is formed in the preformed pattern. The metallic article is separated from the electrically conductive mandrel, which forms a free-standing metallic article that may be coupled with the surface of a semiconductor material for a photovoltaic cell.
Method For Three-Dimensional Packaging Of Electronic Devices
Venkatesan Murali - San Jose CA, US Arvind Chari - Saratoga CA, US Gopal Prabhu - San Jose CA, US
Assignee:
GTAT Corporation - Nashua NH
International Classification:
H01L 21/768
US Classification:
438667, 257E21585
Abstract:
An interposer is fabricated from a lamina. A donor body is provided, ions are implanted into a first surface of the donor body to define a cleave plane, a temporary carrier is separably contacted to the donor body, and the lamina is cleaved from the donor body. The lamina has front surface and a back surface, with a thickness from the front surface to the back surface. A via hole is formed in the lamina, where the via hole extends through the thickness of the lamina. The temporary carrier is removed from the lamina, and the lamina may be fabricated into an interposer for three-dimensional integrated circuit packages.
Gopal Prabhu - San Jose CA, US Kathy J. Jackson - Felton CA, US Orion Leland - Fremont CA, US Aditya Agarwal - Sunnyvale CA, US
Assignee:
TWIN CREEKS TECHNOLOGIES, INC. - San Jose CA
International Classification:
H01L 21/304
US Classification:
438691, 257E21237
Abstract:
A donor wafer, for example of silicon, has an irregular surface following cleaving of a lamina from the surface, for example by exfoliation following implant of hydrogen and/or helium ions to define a cleave plane. Pinholes in the lamina leave column asperities at the exfoliated surface of the donor wafer, and the beveled edge may leave an edge asperity which fails to exfoliate. To prepare the surface of the donor wafer for reuse, mechanical grinding removes the column and edge asperities, and minimal additional thickness. Following cleaning, growth and removal of an oxide layer at the surface rounds remaining peaks. The smoothed surface is well adapted to bonding to a receiver element and exfoliation of a new lamina. A variety of devices may be fabricated from the lamina, for example a photovoltaic cell.
Microwave Anneal Of A Thin Lamina For Use In A Photovoltaic Cell
Mohamed M. Hilali - Sunnyvale CA, US Murali Venkatesan - Santa Clara CA, US Gopal Prabhu - San Jose CA, US Zhiyong Li - San Jose CA, US
Assignee:
TWIN CREEKS TECHNOLOGIES, INC. - San Jose CA
International Classification:
H01L 21/322
US Classification:
438 58, 438458, 257E21317
Abstract:
A cleave plane is defined in a semiconductor donor body by implanting ions into the wafer. A lamina is cleaved from the donor body, and a photovoltaic cell is formed which comprises the lamina. The implant may cause some damage to the crystal structure of the lamina. This damage can be repaired by annealing the lamina using microwave energy. If the lamina is bonded to a receiver element, the receiver element may be either transparent to microwaves, or may reflect microwaves, while the semiconductor material absorbs the microwaves. In this way the lamina can be annealed at high temperature while the receiver element remains cooler.
Back-Contact Photovoltaic Cell Comprising A Thin Lamina Having A Superstrate Receiver Element
Steven M. Zuniga - Soquel CA, US Christopher J. Petti - Mountain View CA, US Gopal Prabhu - San Jose CA, US
Assignee:
Twin Creeks Technologies, Inc. - San Jose CA
International Classification:
H01L 31/0352 H01L 31/02
US Classification:
136255, 438 68, 257E3111
Abstract:
A method to fabricate a photovoltaic device includes forming first and second contact regions at the first surface of a semiconductor donor body. A cleave plane may be formed by implanting ions into the donor body, and a lamina that includes the contact regions is cleaved from the donor body at the cleave plane. The first surface of the lamina may be contacted with a temporary support and fabricated into a photovoltaic device, wherein the lamina comprises the base of the photovoltaic device.
Venkatesan Murali - San Jose CA, US Gopal Prabhu - San Jose CA, US Orion Leland - Fremont CA, US
Assignee:
Twin Creeks Technologies, Inc. - San Jose CA
International Classification:
H01L 31/0376 H01L 31/18
US Classification:
136258, 438 96, 257E31047
Abstract:
The invention provides for a semiconductor wafer with a metal support element suitable for the formation of a flexible or sag tolerant photovoltaic cell. A method for forming a photovoltaic cell may comprise providing a semiconductor wafer have a thickness greater than 150 μm, the wafer having a first surface and a second surface opposite the first and etching the semiconductor wafer a first time so that the first etching reduces the thickness of the semiconductor wafer to less than 150 μm. After the wafer has been etched a first time, a metal support element may be constructed on or over the first surface; and a photovoltaic cell may be fabricated, wherein the semiconductor wafer comprises the base of the photovoltaic cell.
The invention provides a method of forming an electronic device from a lamina that has a coefficient of thermal expansion that is matched or nearly matched to a constructed metal support. In some embodiments the method comprises implanting the top surface of a donor body with an ion dosage to form a cleave plane followed by exfoliating a lamina from the donor body. After exfoliating the lamina, a flexible metal support that has a coefficient of thermal expansion with a value that is within 10% of the value of the coefficient of thermal expansion of the lamina is constructed on the lamina. In some embodiments the coefficients of thermal expansion of the metal support and the lamina are within 10% or within 5% of each other between the temperatures of 100 and 600 C.
Venkatesan Murali - San Jose CA, US Gopal Prabhu - San Jose CA, US Christopher J. Petti - Mountain View CA, US
Assignee:
TWIN CREEKS TECHNOLOGIES, INC. - San Jose CA
International Classification:
H01L 21/20 H01L 29/06
US Classification:
257618, 438478, 257E29005, 257E2109
Abstract:
The invention provides a method of forming an electronic device from a lamina that has a coefficient of thermal expansion that is matched or nearly matched to a constructed metal support. In some embodiments the method comprises implanting the top surface of a donor body with an ion dosage to form a cleave plane followed by exfoliating a lamina from the donor body. After exfoliating the lamina, a flexible metal support that has a coefficient of thermal expansion with a value that is within 10% of the value of the coefficient of thermal expansion of the lamina is constructed on the lamina. In some embodiments the coefficients of thermal expansion of the metal support and the lamina are within 10% or within 5% of each other between the temperatures of 500 and 1050 C.