Yiwen H Li

US Patent:

8608921, Dec 17, 2013

Filed:

Jan 20, 2011

Appl. No.:

13/010640

Inventors:

Xiaolong Li - Granada Hills CA, US
Rajiv Shah - Rancho Palos Verdes CA, US
Qingling Yang - Northridge CA, US
Yiwen Li - Arcadia CA, US
Barry Phong Pham - Sun Valley CA, US

Assignee:

Medtronic MiniMed, Inc. - Northridge CA

International Classification:

G01N 27/327
G01N 27/416

US Classification:

20440311, 20440304, 20440314, 435 14

Abstract:

Embodiments of the invention provide amperometric analyte sensors having optimized elements such as electrodes formed from sputtered platinum compositions as well as layers of material selected to optimize the characteristics of a wide variety of sensor elements and sensors. While embodiments of the innovation can be used in a variety of contexts, typical embodiments of the invention include glucose sensors used in the management of diabetes.

US Patent:

20120190950, Jul 26, 2012

Filed:

Jan 20, 2011

Appl. No.:

13/010636

Inventors:

Qingling Yang - Northridge CA, US
Rajiv Shah - Rancho Palos Verdes CA, US
Xiaolong Li - Granada Hills CA, US
Barry Phong Pham - Sun Valley CA, US
Yiwen Li - Arcadia CA, US

Assignee:

MEDTRONIC MINIMED, INC. - Northridge CA

International Classification:

A61B 5/1468
G01N 27/333
B05D 1/36
B05D 5/12
C23C 16/50
H01B 1/22
G01N 33/50

US Classification:

600345, 252514, 204416, 20440314, 204415, 20440301, 427 211

Abstract:

Embodiments of the invention provide amperometric analyte sensors having optimized elements such as electrodes formed from sputtered platinum compositions as well as layers of material selected to optimize the characteristics of a wide variety of sensor elements and sensors. While embodiments of the innovation can be used in a variety of contexts, typical embodiments of the invention include glucose sensors used in the management of diabetes.

US Patent:

20130328572, Dec 12, 2013

Filed:

Feb 27, 2013

Appl. No.:

13/778391

Inventors:

Michael E. Miller - Culver City CA, US
Raghavendhar Gautham - Los Angeles CA, US
Yiwen Li - Arcadia CA, US
Rajiv Shah - Rancho Palos Verdes CA, US

International Classification:

G01R 35/00

US Classification:

324601

Abstract:

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.

US Patent:

20130331674, Dec 12, 2013

Filed:

Feb 27, 2013

Appl. No.:

13/778630

Inventors:

Raghavendhar Gautham - Los Angeles CA, US
Bradley C. Liang - Bloomfield Hills MI, US
Rajiv Shah - Rancho Palos Verdes CA, US
Catherine M. Szyman - Westlake Village CA, US
Michael E. Miller - Culver City CA, US
Yiwen Li - Arcadia CA, US
Wayne A. Morgan - Northridge CA, US
Paris Chen - Chino Hills CA, US
Robert C. Mucic - Glendale CA, US
Genival D. de Barros - Porter Ranch CA, US
Carlos A. Callirgos - Northridge CA, US
Manjunath Sirigiri - Northridge CA, US
Joseph Paul Brinson - Valencia CA, US

International Classification:

G01R 35/00
A61B 5/145

US Classification:

600347, 324600, 324601, 702 65

Abstract:

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.

US Patent:

20140012115, Jan 9, 2014

Filed:

Jul 3, 2012

Appl. No.:

13/541262

Inventors:

Yiwen Li - Arcadia CA, US
Rajiv Shah - Rancho Palos Verdes CA, US

Assignee:

MEDTRONIC MINIMED, INC. - Northridge CA

International Classification:

A61B 5/1473
C23C 16/50

US Classification:

600347, 427 212

Abstract:

Embodiments of the invention provide methods and materials for making analyte sensors having a plurality of layered elements such as amperometric glucose sensors that are used by diabetic individuals to monitor blood sugar concentrations. Embodiments of the invention utilize plasma deposition technologies to form thin films of adhesion promoting compositions useful in such sensors. Sensors that incorporate the thin film compositions formed by these processes exhibit a number of desirable characteristics.

US Patent:

20200237268, Jul 30, 2020

Filed:

Apr 20, 2020

Appl. No.:

16/853461

Inventors:

- Northridge CA, US
Michael E. Miller - Culver City CA, US
Raghavendhar Gautham - Northridge CA, US
Yiwen Li - Arcadia CA, US
Rajiv Shah - Rancho Palos Verdes CA, US

International Classification:

A61B 5/1495
G01N 27/416
A61B 5/00
A61M 5/158
A61B 5/1486
A61M 5/142
A61B 5/1459
G01R 35/00
A61B 5/145
A61B 5/1473
A61B 5/053
G01N 33/66
A61M 5/172
G01N 27/02
G01N 33/96
G01N 33/49

Abstract:

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.

US Patent:

20190269355, Sep 5, 2019

Filed:

May 22, 2019

Appl. No.:

16/419624

Inventors:

- Northridge CA, US
Michael E. Miller - Culver City CA, US
Raghavendhar Gautham - Northridge CA, US
Yiwen Li - Arcadia CA, US
Rajiv Shah - Rancho Palos Verdes CA, US

International Classification:

A61B 5/1495
A61B 5/053
G01R 35/00
G01N 33/66
G01N 27/416
A61B 5/00
G01N 33/96
G01N 33/49
G01N 27/02
A61M 5/172
A61B 5/145
A61M 5/142
A61B 5/1486
A61M 5/158
A61B 5/1459
A61B 5/1473

Abstract:

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.

US Patent:

20180074010, Mar 15, 2018

Filed:

Nov 20, 2017

Appl. No.:

15/818111

Inventors:

- Northridge CA, US
Michael E. Miller - Culver City CA, US
Raghavendhar Gautham - Los Angeles CA, US
Yiwen Li - Arcadia CA, US
Rajiv Shah - Rancho Palos Verdes CA, US

International Classification:

G01N 27/416
G01R 35/00
A61B 5/145
A61B 5/1459
A61B 5/1473
A61B 5/1486
G01N 33/66
G01N 27/02
A61M 5/172
A61M 5/158
A61B 5/00
A61B 5/1495
A61M 5/142
A61B 5/053

Abstract:

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.