Alexandre Y Fong

US Patent:

20110084717, Apr 14, 2011

Filed:

Oct 13, 2010

Appl. No.:

12/903633

Inventors:

Alexandre Y. Fong - Orlando FL, US
Christopher N. Pannell - Orlando FL, US
Robert Bronson, JR. - Longwood FL, US

Assignee:

GOOCH AND HOUSEGO PLC - Somerset

International Classification:

G01R 31/00

US Classification:

32475001

Abstract:

A system for measuring an optical spectral response of a photoelectric device under test (DUT) includes a spectrally programmable light source including in optically coupled sequence a broadband light source for emitting light, a dispersive element for dispersing light, and a spatial light modulator for controlling an intensity and a spectra of the light to provide a spectrally programmable light beam. A light distributing device having at least one input portion is coupled to receive the spectrally programmable light beam and includes a light distributing structure for distributing the spectrally programmable light beam in a known ratio to a first area and at least a second area. A reference detector having a reference output positioned at the first area, and the DUT is positioned at the second area. Data acquisition electronics and a processor can receive simultaneously generated output signals from the DUT and the reference detector to correct for intensity variation in the spectrally programmable light beam in determining the optical spectral response of the DUT.