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Ambrish Tyagi

age ~44

from Sunnyvale, CA

Also known as:
  • Ameriah Tyagi
  • Yagia T Ambrish
Phone and address:
1478 Chickadee Ct, Sunnyvale, CA 94087

Ambrish Tyagi Phones & Addresses

  • 1478 Chickadee Ct, Sunnyvale, CA 94087
  • Palo Alto, CA
  • Dublin, OH
  • Foster City, CA
  • Columbus, OH
  • 2266 Louis Rd, Palo Alto, CA 94303

Us Patents

  • Method And Apparatus For Projective Volume Monitoring

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  • US Patent:
    20130076866, Mar 28, 2013
  • Filed:
    Jul 3, 2012
  • Appl. No.:
    13/541399
  • Inventors:
    John Drinkard - Freemont CA, US
    Ambrish Tyagi - Palo Alto CA, US
    Yoshiharu Tani - Yoshiharu, JP
    Koichi Kinoshita - Kyoto, JP
  • Assignee:
    OMRON CORPORATION - Kyoto
  • International Classification:
    H04N 7/18
  • US Classification:
    348 47
  • Abstract:
    According to one aspect of the teachings presented herein, a machine vision system includes one or more sensor units that are each advantageously configured to use different pairings among a set of spaced-apart image sensors, to provide redundant object detection for a primary monitoring zone, while simultaneously providing for the detection of objects that may shadow the primary monitoring zone. Further, a plurality of “mitigations” and enhancements provide safety-of-design and robust operation. Such mitigations and enhancements include, for example, bad-pixel detection and mapping, cluster-based pixel processing for improved object detection, test-image injection for fault detection, dual-channel, redundant processing for safety-critical object detection, temporal filtering to reduce false detections, and the use of high dynamic range (HDR) images, for improved operation over variable ambient lighting conditions.
  • Method And Apparatus To Guarantee Minimum Contrast For Machine Vision System

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  • US Patent:
    20130300835, Nov 14, 2013
  • Filed:
    May 13, 2013
  • Appl. No.:
    13/892907
  • Inventors:
    Ambrish Tyagi - Palo Alto CA, US
    John Drinkard - Foster City CA, US
    Yoshiharu Tani - Kusatsu, JP
  • International Classification:
    G09G 1/00
    H04N 13/02
    G06T 7/00
  • US Classification:
    348 46, 382154
  • Abstract:
    In one aspect, this disclosure presents a method and apparatus for verifying that minimum object contrast requirements are met within a region representing a volume to be monitored by a machine vision system. In complementary fashion, the disclosure also presents a methodology for constraining the positions of the lighting sources to be used for illuminating the monitored volume at a minimum height above the floor, and for the use of a key light that provides asymmetrical lighting within the monitored volume relative to the camera(s) used for imaging the monitored volume. Correspondingly, the disclosure also presents a method and apparatus for monitoring for proper operation of the key light and responding to improper operation. The minimum contrast verification and key light monitoring operations can be implemented using standalone apparatuses, or can be incorporated into the machine vision system.
  • Method And Apparatus For Generating Texture In A Three-Dimensional Scene

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  • US Patent:
    20110242283, Oct 6, 2011
  • Filed:
    Mar 30, 2011
  • Appl. No.:
    13/075214
  • Inventors:
    Ambrish Tyagi - Palo Alto CA, US
    John Drinkard - Foster City CA, US
  • International Classification:
    H04N 13/02
  • US Classification:
    348 46, 348E13074
  • Abstract:
    In one aspect of the teachings herein, a 3D imaging apparatus uses a “texture tool” or facilitates the use of such a tool by an operator, to add artificial texture to a scene being imaged, for 3D imaging of surfaces or background regions in the scene that otherwise lack sufficient texture for determining sufficiently dense 3D range data. In at least one embodiment, the 3D imaging apparatus provides for iterative or interactive imaging, such as by dynamically indicating that one or more regions of the scene require artificial texturing via the texture tool for accurate 3D imaging, and then indicating whether or not the addition of artificial texture cured the texture deficiency and/or whether any other regions within the image require additional texture.
  • Video Ingestion And Clip Creation

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  • US Patent:
    20190273837, Sep 5, 2019
  • Filed:
    Mar 7, 2019
  • Appl. No.:
    16/295557
  • Inventors:
    - Seattle WA, US
    Eduard Oks - Holon IL, US
    Rohith Mysore Vijaya Kumar - Sunnyvale CA, US
    Apoorv Chaudhri - Sunnyvale CA, US
    Yadunandana Nagaraja Rao - Sunnyvale CA, US
    Ambrish Tyagi - Palo Alto CA, US
  • International Classification:
    H04N 1/21
  • Abstract:
    Devices, systems and methods are disclosed for reducing a perceived latency associated with uploading and annotating video data. For example, video data may be divided into video sections that are uploaded individually so that the video sections may be annotated as they are received. This reduces a latency associated with the annotation process, as a portion of the video data is annotated before an entirety of the video data is uploaded. In addition, the annotation data may be used to generate a master clip table and extract individual video clips from the video data.
  • Method And Apparatus For Detecting And Mitigating Mechanical Misalignments In An Optical System

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  • US Patent:
    20150271474, Sep 24, 2015
  • Filed:
    Mar 18, 2015
  • Appl. No.:
    14/661603
  • Inventors:
    - Kyoto, JP
    John Drinkard - Foster City CA, US
    Ambrish Tyagi - Palo Alto CA, US
  • International Classification:
    H04N 13/02
    G06T 7/00
  • Abstract:
    According to one aspect of the teachings herein, a method and apparatus detect mechanical misalignments in a machine vision system during run-time operation of the machine vision system, and compensate image processing based on the detected misalignments, unless the detected misalignments are excessive. Excessive misalignments may be detected by determining a worst-case error based on them. If the worst-case error exceeds a defined limit, the machine vision system transitions to a fault state. The fault state may include disrupting operation of a hazardous machine or performing one or more other fault-state operations. Among the detected misalignments are internal misalignments within individual cameras used for imaging, and relative misalignments between cameras. The method and apparatus may further perform run-time verifications of focus and transition the machine vision system to a fault state responsive to detecting insufficient focal quality.

Resumes

Ambrish Tyagi Photo 1

Principal Scientist, Senior Manager, Advanced

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Location:
219 west 9Th Ave, Columbus, OH 43201
Industry:
Research
Work:
Bira 91 Jan 2014 - Feb 2018
Investor

Omron Corporation Nov 2008 - Apr 2013
Computer Vision Scientist

Amazon Lab126 Nov 2008 - Apr 2013
Senior Research Scientist, Manager, Advanced Cv Products

Reactrix Systems, Inc. Aug 2008 - Oct 2008
Computer Vision Scientist

The Ohio State University Sep 2002 - Jul 2008
Research Associate
Education:
The Ohio State University 2002 - 2008
Doctorates, Doctor of Philosophy, Cognitive Science
Delhi College of Engineering 1998 - 2002
Bachelor of Engineering, Bachelors, Computer Engineering
Department of Management Studies, Nsut 1998 - 2002
Bachelor of Engineering, Bachelors, Computer Engineering
Delhi Public School - R. K. Puram 1984 - 1998
Skills:
Computer Vision
Machine Learning
Algorithms
Image Processing
Sensors
Matlab
Pattern Recognition
Signal Processing
Opencv
Software Engineering
Computer Graphics
Artificial Intelligence
Human Computer Interaction
3D Reconstruction
Sensor Fusion
Robotics
C
Image Sensors
Optimizations
Embedded Systems
Computer Science
Stereoscopic
Stereo 3D
Computational Geometry
C++
Python
Interests:
Mobile
Clean Technology
Health Care
Internet of Things
Consumer Electronics
Enterprise Software
Consumer Internet
Computer Vision
Languages:
Hindi
English
Ambrish Tyagi Photo 2

Ambrish Tyagi

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Ambrish Tyagi

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Ambrish Tyagi Photo 4

Ambrish Kumar Tyagi

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Ambrish Tyagi Photo 5

Ambrish Tyagi

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Ambrish Tyagi Photo 6

Ambrish Mohan Tyagi

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Ambrish Tyagi Photo 7

Ambrish Tyagi

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Plaxo

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Ambrish Tyagi

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Googleplus

Ambrish Tyagi Photo 9

Ambrish Tyagi

Lived:
Palo Alto, CA
New Delhi, India
Foster City, CA
Columbus, OH
Work:
Amazon.com - Sr. Research Scientist (2013)
Omron Corporation - Scientist (2008-2013)
Reactrix Systems, Inc. (2008-2008)
IBM Research (2005-2006)
Education:
The Ohio State University, University of Delhi - NSIT
About:
My current role involves R&D related to various computer vision techniques applicable to the domain of industrial automation at the Omron Corporation. In past I've worked on the problem of hu...
Ambrish Tyagi Photo 10

Ambrish Tyagi

Ambrish Tyagi Photo 11

Ambrish Tyagi

Work:
Sardar valabh bhai patel kirshi university meerut - I am a doctor

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