Christian Nemets - Camarillo CA, US Michael Woelki - Stow MA, US Amit V. Engineer - Chelmsford MA, US
Assignee:
GSI Group Corporation - Billerica MA
International Classification:
G01N 21/86
US Classification:
2505594, 2502081
Abstract:
A system and method for inspecting machine readable marks on one side of a wafer without requiring transmission of radiant energy from another side of the wafer and through the wafer. The wafer has articles which may include die, chip scale packages, circuit patterns and the like. The marking occurs in a wafer marking system and within a designated region relative to an article position. The articles have a pattern on a first side. The method includes the steps of imaging a first side of the wafer, imaging a second side of the wafer, establishing correspondence between a portion of first side image and a portion of a second side image, and superimposing image data from the first and second sides to determine at least the position of a mark relative to an article.
Ipg Photonics
Principal Software Engineer
Esi May 2013 - Jun 2015
Principal Software Engineer
The Gsi Group, Inc. Jan 2001 - May 2013
Principal Software Engineer
Contech Software Jun 1998 - Dec 2000
Project Leader
Samyak Instrumentation Jun 1996 - Jun 1998
Senior Software Engineer
Education:
Villanova University 2006 - 2007
Masters, Project Management
Gujarat University 1990 - 1994
Bachelor of Engineering, Bachelors, Computer Science
Skills:
Software Engineering Software Project Management Asp.net Software Development Windows Services Debugging Client/Server Software Development Life Cycle Embedded Software C# Automation Embedded Systems Troubleshooting .Net Databases Semiconductors Engineering Project Management Operating Systems System Architecture Hardware Device Drivers Visual C++ Leadership Software Design