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Andrey P Vertikov

age ~58

from Westwood, MA

Also known as:
  • Andrrey P Vertikov
  • Andrei P Vertikov
  • Audrey P Vertikov
  • Anrey Vertikov
  • Vertikov Andrey
Phone and address:
315 Oak St, Islington, MA 02090
(781)7622569

Andrey Vertikov Phones & Addresses

  • 315 Oak St, Westwood, MA 02090 • (781)7622569
  • Norwood, MA
  • 173 Dafrack Dr, Lake Hiawatha, NJ 07034 • (973)3160635
  • Budd Lake, NJ
  • Providence, RI
  • 173A Dafrack Dr, Lake Hiawatha, NJ 07034 • (973)4935626

Work

  • Position:
    Transportation and Material Moving Occupations

Education

  • Degree:
    Bachelor's degree or higher

Us Patents

  • Delivering Light Via Optical Waveguide And Multi-View Optical Probe Head

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  • US Patent:
    7706646, Apr 27, 2010
  • Filed:
    Mar 7, 2008
  • Appl. No.:
    12/075129
  • Inventors:
    Feiling Wang - Medford MA, US
    Andrey Vertikov - Westwood MA, US
  • Assignee:
    Tomophase Corporation - Burlington MA
  • International Classification:
    G02B 6/00
    G02B 6/06
    G02B 6/32
    G02B 6/42
    G02B 6/44
  • US Classification:
    385 33, 385 11, 385 31, 385100, 385109, 362572, 362574
  • Abstract:
    Techniques, apparatus and systems that use an optical probe head to deliver light to a target and to collect light from the target for imaging, monitoring, medical diagnostics and medical treatment applications.
  • Delivering Light Via Optical Waveguide And Multi-View Optical Probe Head

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  • US Patent:
    8041162, Oct 18, 2011
  • Filed:
    Apr 26, 2010
  • Appl. No.:
    12/767729
  • Inventors:
    Feiling Wang - Medford MA, US
    Andrey Vertikov - Westwood MA, US
  • Assignee:
    Tomophase Corporation - Burlington MA
  • International Classification:
    G02B 6/00
    G02B 6/06
    G02B 6/26
    G02B 6/42
    G02B 6/44
  • US Classification:
    385 33, 385 11, 385 31, 385100, 385109, 362572, 362574
  • Abstract:
    Techniques, apparatus and systems that use an optical probe head to deliver light to a target and to collect light from the target for imaging, monitoring, medical diagnostics and medical treatment applications.
  • Threshold Determination In An Inspection System

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  • US Patent:
    8260035, Sep 4, 2012
  • Filed:
    Sep 22, 2006
  • Appl. No.:
    11/525527
  • Inventors:
    Mehmet Tek - Quincy MA, US
    Timothy Tiemeyer - Providence RI, US
    Andrey Vertikov - Westwood MA, US
  • Assignee:
    KLA-Tencor Corporation - Milpitas CA
  • International Classification:
    G06K 9/00
  • US Classification:
    382152, 382100, 382141, 382149, 382145
  • Abstract:
    A method and system for inspecting a surface of a semiconductor workpiece comprises providing a surface inspection system and using the surface inspection apparatus to cause laser light to impinge upon a test location on the workpiece surface and thereby cause the laser light to emerge from the surface as returned light comprising at least one of reflected light and scatter light; collecting the returned light and generating a signal from the returned and collected light, the signal comprising a signal value representative of a characteristic of the workpiece surface at the test location; providing a plurality of threshold candidates and causing the surface inspection system to select a threshold from among the plurality of threshold candidates; comparing the threshold to the signal value to obtain a difference value; using the difference value to assess the characteristic of the workpiece surface at the test location; and using the surface inspection system to automatically cause the method to be repeated for a plurality of test locations on the workpiece surface.
  • Temperature Profile Mapping And Guided Thermotherapy

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  • US Patent:
    8452383, May 28, 2013
  • Filed:
    Mar 2, 2009
  • Appl. No.:
    12/920309
  • Inventors:
    Peter E. Norris - Cambridge MA, US
    Xiao-Li Li - Lexington MA, US
    Andrey Vertikov - Westwood MA, US
  • Assignee:
    Tomophase Corporation - Burlington MA
  • International Classification:
    A61B 6/00
  • US Classification:
    600478, 600476, 600473, 606 46
  • Abstract:
    Techniques, apparatus and systems that use an optical probe head to deliver light to a target and to collect light from the target for imaging and monitoring a target while a separate radiation is applied to treat the target.
  • Method And Apparatus For Decreasing Thermal Loading And Roughness Sensitivity In A Photoacoustic Film Thickness Measurement System

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  • US Patent:
    20020135784, Sep 26, 2002
  • Filed:
    Mar 6, 2002
  • Appl. No.:
    10/092866
  • Inventors:
    Christopher Morath - Morristown NJ, US
    Andrey Vertikov - Lake Hiawatha NJ, US
  • Assignee:
    Rudolph Technologies, Inc. - Flanders NJ
  • International Classification:
    G01B011/06
  • US Classification:
    356/630000
  • Abstract:
    Disclosed are methods and apparatus for reducing thermal loading of a film disposed on a surface of a sample, such as a semiconductor wafer, while obtaining a measurement of a thickness of the film in an area about a measurement site. The method includes steps of (a) bringing an optical assembly of the measurement system into focus; (b) aligning a beam spot with the measurement site; (c) turning on one of a dither EOM or a dither AOM or a piezo-electric dither assembly to sweep the beam spot in an area about the measurement site, thereby reducing the thermal loading within the measurement site; (d) making a measurement by obtaining a signal representing an average for the film under the area; (e) recording the measurement data; and (f) analyzing the measurement data to determine an average film thickness in the measurement area.
  • Combined Ultra-Fast X-Ray And Optical System For Thin Film Measurements

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  • US Patent:
    20060256916, Nov 16, 2006
  • Filed:
    May 13, 2005
  • Appl. No.:
    11/129282
  • Inventors:
    Michael Kotelyanskii - Chatham NJ, US
    Andrey Vertikov - Lake Hiawatha NJ, US
    Christopher Morath - Basking Ridge NJ, US
  • International Classification:
    G01N 23/20
  • US Classification:
    378071000
  • Abstract:
    A system comprising a means for generating an optical pump beam pulse and for directing the optical pump beam pulse to a first area of a surface of a sample having a plurality of film layers to generate an acoustic signal, a means for generating an x-ray probe pulse and for directing the x-ray probe pulse to a second area of the surface, a means for detecting an intensity of a diffracted x-ray probe pulse the intensity varying in response to the acoustic signal to form a probe pulse response signal, and a means for calculating an expected transient response to a theoretical acoustic signal propagated through a model of the sample and fitting the probe pulse response to the transient response to derive at least one characteristic of the sample.
  • Delivering Light Via Optical Waveguide And Multi-View Optical Probe Head

    view source
  • US Patent:
    20120033911, Feb 9, 2012
  • Filed:
    Oct 18, 2011
  • Appl. No.:
    13/276281
  • Inventors:
    Feiling Wang - Medford MA, US
    Andrey Vertikov - Westwood MA, US
  • Assignee:
    TOMOPHASE CORPORATION - Burlington MA
  • International Classification:
    G02B 6/126
  • US Classification:
    385 11
  • Abstract:
    Techniques, apparatus and systems that use an optical probe head to deliver light to a target and to collect light from the target for imaging, monitoring, medical diagnostics and medical treatment applications.
  • Temperature Profile Mapping And Guided Thermotherapy

    view source
  • US Patent:
    20130261613, Oct 3, 2013
  • Filed:
    May 28, 2013
  • Appl. No.:
    13/903983
  • Inventors:
    Xiao-Li Li - Lexington MA, US
    Andrey Vertikov - Westwood MA, US
  • International Classification:
    A61B 18/18
    A61B 17/32
    A61B 18/20
  • US Classification:
    606 14, 606 33, 606169
  • Abstract:
    Techniques, apparatus and systems that use an optical probe head to deliver light to a target and to collect light from the target for imaging and monitoring a target while a separate radiation is applied to treat the target.

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