April Horlacher Thomas

US Patent:

20090299671, Dec 3, 2009

Filed:

Jun 1, 2009

Appl. No.:

12/476133

Inventors:

Elliot B. Jones - San Francisco CA, US
Loren Y. Olson - San Jose CA, US
Anthony J. Romanelli - Milford MA, US
John Joseph Gibbons - Brampton, CA
April L. Thomas - Marshfield MA, US

International Classification:

G06F 19/00

US Classification:

702 85

Abstract:

Mass spectrometer parameters used to tune a mass spectrometer for multiple reaction monitoring (MRM) are determined from a single injection of a sample. Two or more precursor ion scans and a plurality of product ion scans for each precursor ion scan are performed from the injection. Each precursor ion scan is produced with different mass spectrometer parameters that create a different level of ion current. The mass spectra of the precursor ion scans are analyzed to determine if saturation has occurred in any of the precursor ion scans. A precursor ion scan that produces the highest ion current with the least amount of saturation is selected. The mass spectrometer parameters used to tune the mass spectrometer for MRM are determined from (1) the mass spectrometer parameters of the selected precursor ion scan and (2) the mass spectrometer parameters of product ion scans from fragments of the selected precursor ion scan.