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Aram Chung

age ~45

from Schenectady, NY

Aram Chung Phones & Addresses

  • 11 Natalie Ct, Schenectady, NY 12304
  • Rensselaer, NY
  • Los Angeles, CA
  • Ithaca, NY

Us Patents

  • Surface Enhanced Raman Scattering (Sers) Apparatus, Methods And Applications

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  • US Patent:
    20130050695, Feb 28, 2013
  • Filed:
    Aug 29, 2012
  • Appl. No.:
    13/597688
  • Inventors:
    David Erickson - Ithaca NY, US
    Aram J. Chung - Los Angeles CA, US
    Yun Suk Huh - Daejeon, KR
  • Assignee:
    Cornell University - Cornell Center for Technology Enterprise & Commercialization (CCTEC) - Ithaca NY
  • International Classification:
    G01J 3/44
    B32B 37/24
  • US Classification:
    356301, 156242
  • Abstract:
    Surface enhanced Raman scattering (SERS) substrates may be fabricated using a shadow mask assisted evaporation (SMAE) method to provide for enhanced detection sensitivity with respect to target molecules that are located upon, and sensitized by, the SERS enhanced substrates. Such SERS substrates provide a two dimensional array of repeating nanostructures that may include, but are not limited to nano-pillar, nano-nib, nano-elliptical cylinder and nano-triangular tip nanostructures, any of which may be augmented with gold nanospheres. The particular SERS enhanced substrates in accordance with the embodiments, in particular when augmented with gold nanospheres, provide desirably enhanced sensitivity.
  • Optofluidic Apparatus, Method, And Application

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  • US Patent:
    20120269481, Oct 25, 2012
  • Filed:
    Oct 27, 2010
  • Appl. No.:
    13/504297
  • Inventors:
    David Erickson - Ithaca NY, US
    Aram J. Chung - Ithaca NY, US
    Erica E. Jung - Ithaca NY, US
  • Assignee:
    CORNELL UNIVERSITY - Ithaca NY
  • International Classification:
    G02B 6/26
  • US Classification:
    385 16
  • Abstract:
    A reconfigurable optofluidic apparatus includes a microfluidic chip including a microfluidic channel further including an inlet for a liquid core waveguide fluid; a channel pathway for the liquid core waveguide fluid; a plurality of non-core waveguide fluid inlets; a switching chamber having a larger cross sectional area than the channel pathway; and an outlet for the liquid core waveguide fluid and non-core waveguide fluid, further including a plurality of non-liquid core waveguides disposed in the switching chamber. Light input to the apparatus propagates in the liquid core/liquid cladding (liquid) waveguide. The path of the liquid waveguide can be steered in a region of the apparatus over one of the non-liquid core waveguides such that the light is end-fire- or evanescently-coupled into the non-liquid core waveguide and output therefrom or between two of the non-liquid core waveguides and not coupled or output. Associated optofluidic switching methods are disclosed.
  • System And Method For Deforming And Analyzing Particles

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  • US Patent:
    20210341376, Nov 4, 2021
  • Filed:
    Mar 12, 2021
  • Appl. No.:
    17/200728
  • Inventors:
    - Oakland CA, US
    Daniel R. Gossett - Los Angeles CA, US
    Henry T.K. Tse - San Francisco CA, US
    Aram Chung - Los Angeles CA, US
  • Assignee:
    THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
  • International Classification:
    G01N 15/14
    G01N 33/50
    G01N 21/64
    G06K 9/46
    G06T 7/00
  • Abstract:
    A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.
  • System And Method For Deforming And Analyzing Particles

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  • US Patent:
    20190250092, Aug 15, 2019
  • Filed:
    Apr 3, 2019
  • Appl. No.:
    16/374663
  • Inventors:
    - Oakland CA, US
    Daniel R. Gossett - Los Angeles CA, US
    Henry T.K. Tse - San Francisco CA, US
    Aram Chung - Los Angeles CA, US
  • Assignee:
    THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
  • International Classification:
    G01N 15/14
    G06T 7/00
    G01N 33/50
    G01N 21/64
    G06K 9/46
  • Abstract:
    A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.
  • System And Method For Deforming And Analyzing Particles

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  • US Patent:
    20170234788, Aug 17, 2017
  • Filed:
    Mar 28, 2017
  • Appl. No.:
    15/471851
  • Inventors:
    - Oakland CA, US
    Daniel R. Gossett - Los Angeles CA, US
    Henry T.K. Tse - San Francisco CA, US
    Aram Chung - Los Angeles CA, US
  • Assignee:
    THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
  • International Classification:
    G01N 15/14
    G01N 21/64
  • Abstract:
    A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.
  • System And Method For Deforming And Analyzing Particles

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  • US Patent:
    20170089822, Mar 30, 2017
  • Filed:
    Dec 13, 2016
  • Appl. No.:
    15/377659
  • Inventors:
    - South San Francisco CA, US
    Daniel R. Gossett - Los Angeles CA, US
    Henry T.K. Tse - San Francisco CA, US
    Aram Chung - Los Angeles CA, US
  • Assignee:
    CytoVale Inc. - South San Francisco CA
  • International Classification:
    G01N 15/14
    G06K 9/46
    G06T 7/00
  • Abstract:
    A system for deforming and analyzing particles includes a substrate defining an inlet, and an outlet; a fluidic pathway fluidly coupled to the inlet and the outlet and defining a delivery region upstream of a deformation region configured to deform particles, wherein the fluidic pathway comprises a first branch configured to generate a first flow, and a second branch configured to generate a second flow that opposes the first flow, wherein an intersection of the first flow and the second flow defines the deformation region; a detection module including a sensor configured to generate a morphology dataset characterizing deformation of the particles, and a photodetector configured to generate a fluorescence dataset characterizing fluorescence of the particles; and a processor configured to output an analysis of the plurality of particles based at least in part on the deformation dataset and the fluorescent dataset for the plurality of particles.
  • System And Method For Deforming And Analyzing Particles

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  • US Patent:
    20150355073, Dec 10, 2015
  • Filed:
    Jul 17, 2015
  • Appl. No.:
    14/802293
  • Inventors:
    - Oakland CA, US
    Daniel R. Gossett - Los Angeles CA, US
    Henry T.K. Tse - San Francisco CA, US
    Aram Chung - Los Angeles CA, US
  • Assignee:
    THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
  • International Classification:
    G01N 15/14
  • Abstract:
    A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.
  • System And Method For Deforming And Analyzing Particles

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  • US Patent:
    20140315287, Oct 23, 2014
  • Filed:
    Oct 18, 2013
  • Appl. No.:
    14/058028
  • Inventors:
    - Oakland CA, US
    Daniel R. Gossett - Los Angeles CA, US
    Henry T.K. Tse - San Francisco CA, US
    Aram Chung - Los Angeles CA, US
  • Assignee:
    THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA
  • International Classification:
    G01N 15/14
  • US Classification:
    4352887
  • Abstract:
    A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.

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