Drew Schulke - Austin TX, US Barry Kahr - Austin TX, US Vinod Makhija - Austin TX, US Adolfo Montero - Austin TX, US Hasnain Shabbir - Round Rock TX, US
Assignee:
Dell Products L.P. - Round Rock TX
International Classification:
G21C 17/00
US Classification:
702183, 62211, 702184, 702132, 714 36
Abstract:
Thermal subsystems of manufactured information handling systems are tested for compliance with desired parameters by running a thermal diagnostics module in firmware during one or more manufacturing activities performed on the information handling system. The thermal diagnostics module monitors and stores one or more thermal parameters detected at the information handling system, such as the maximum temperature zone detected during a manufacturing activity. The stored thermal parameter is read after the manufacturing activity and compared with an expected value to determine the status of the thermal subsystem. For instance, an information handling system maximum operating temperature is detected by firmware running on an embedded controller during imaging of a hard disk drive and fails thermal testing if the detected maximum operating temperature exceeds a predetermined value, such as a value that would not be reached if the thermal subsystem functioning properly.
System And Method For Information Handling System Thermal Diagnostics
Drew Schulke - Austin TX, US Barry Kahr - Austin TX, US Vinod Makhija - Austin TX, US Adolfo Montero - Austin TX, US Hasnain Shabbir - Round Rock TX, US
Assignee:
Dell Products L.P. - Round Rock TX
International Classification:
G21C 17/00
US Classification:
702183, 62211, 702132, 702184, 714 36
Abstract:
Thermal subsystems of manufactured information handling systems are tested for compliance with desired parameters by running a thermal diagnostics module in firmware during one or more manufacturing activities performed on the information handling system. The thermal diagnostics module monitors and stores one or more thermal parameters detected at the information handling system, such as the maximum temperature zone detected during a manufacturing activity. The stored thermal parameter is read after the manufacturing activity and compared with an expected value to determine the status of the thermal subsystem. For instance, an information handling system maximum operating temperature is detected by firmware running on an embedded controller during imaging of a hard disk drive and fails thermal testing if the detected maximum operating temperature exceeds a predetermined value, such as a value that would not be reached if the thermal subsystem functioning properly.
System And Method For Detection Of Environmentally-Induced Damage Of Conductive Elements In A Circuit Board
Srinivasan Kadathur - Austin TX, US Barry Kahr - Austin TX, US
Assignee:
DELL PRODUCTS L.P. - Round Rock TX
International Classification:
G01R 31/02
US Classification:
324537
Abstract:
A system and method for detection of environmentally-induced damage of conductive elements in a circuit board are disclosed. A system may include a test module and a detection module operably connected to the test module. The test module may comprise at least one conductive element. The detection module may be operable to detect a change in at least one electrical property associated with the at least one of conductive element, wherein the change occurs at least in part as a result of environmentally-induced damage to the at least one conductive element.
Senior Electrical Engineer, International Product Support at Dell
Location:
Austin, Texas Area
Industry:
Computer Hardware
Work:
Dell - Austin, Texas Area since Aug 2008
Senior Electrical Engineer, International Product Support
Dell - Austin, Texas Area May 2006 - Aug 2008
Sustaining Electrical Engineer
Dell - Austin, Texas Area Mar 2003 - May 2006
Software Engineering Consultant - Product Group
Dell - Austin, Texas Area Nov 2000 - May 2003
Manufacturing Consultant Engineer – Dell Americas Operations
Wabtec Passenger Transit - Spartanburg, SC May 1995 - May 2000
Product Electrical Engineer
Education:
North Carolina State University 1989 - 1992
Bachelor of Science (BS), Electrical and computer Engineering
Clemson University 1995 - 1996
Barry Kahr <c:out value="1988" />graduate of Franklin Regional High School in Murrysville, PA is on Classmates.com. See pictures, plan your class reunion and get caught up with ...
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