Benjamin P Norton

US Patent:

20120331343, Dec 27, 2012

Filed:

Jun 23, 2011

Appl. No.:

13/167661

Inventors:

Benjamin E. Norton - San Francisco CA, US
Andrei V. Izotov - San Diego CA, US

Assignee:

QUALCOMM INCORPORATED - San Diego CA

International Classification:

G06F 11/00

US Classification:

714 25, 714E11018

Abstract:

A procedure for testing an electronic device is disclosed. A computer bundles into command groups multiple test and wait commands of a test sequence. Each command group is sent to the device, reducing the per-message latency of the command transfers. The commands are queued and stored in the device. The wait commands define the timeline of the tests to be executed on the device. For example, each wait command forces a wait state of a length corresponding to the parameter of the wait command. The length of the wait state is measured from the beginning of the test sequence or the completion of the previous wait command. The wait state associated with each wait command may be made longer than the combined conservative estimates of time periods required for executing all the test commands between a previous point in time defined in the test sequence and the current wait command.