Bin Jonathan Liu

US Patent:

20190271739, Sep 5, 2019

Filed:

May 19, 2019

Appl. No.:

16/416242

Inventors:

- Boise ID, US
Nathaniel J. Meier - Boise ID, US
Bin Liu - Boise ID, US

International Classification:

G01R 31/307
H03K 5/133
G01R 31/30
H03L 7/081
H01J 37/26

Abstract:

Apparatuses including test segment circuits and methods for testing the same are disclosed. An example apparatus includes a plurality of segment lines configured to form a ring around a die and a plurality of test segment circuits, each test segment circuit coupled to at least two segment lines of the plurality of segment lines. Each test segment circuit is coupled to a portion of a first signal line, a portion of a second signal line, and a portion of a third signal line and each test segment circuit is configured to control an operation performed on at least one segment line of the plurality of segment lines.

US Patent:

20180364303, Dec 20, 2018

Filed:

Jun 19, 2017

Appl. No.:

15/626941

Inventors:

- BOISE ID, US
NATHANIEL J. MEIER - BOISE ID, US
BIN LIU - BOISE ID, US

Assignee:

MICRON TECHNOLOGY, INC. - BOISE ID

International Classification:

G01R 31/307
G01R 31/30
H03L 7/081
H03K 5/133
H01J 37/26

Abstract:

Apparatuses including test segment circuits and methods for testing the same are disclosed. An example apparatus includes a plurality of segment lines configured to form a ring around a die and a plurality of test segment circuits, each test segment circuit coupled to at least two segment lines of the plurality of segment lines. Each test segment circuit is coupled to a portion of a first signal line, a portion of a second signal line, and a portion of a third signal line and each test segment circuit is configured to control an operation performed on at least one segment line of the plurality of segment lines.

US Patent:

20160118937, Apr 28, 2016

Filed:

Dec 31, 2015

Appl. No.:

14/986478

Inventors:

- BOISE ID, US
Bin Liu - Boise ID, US

Assignee:

MICRON TECHNOLOGY, INC. - BOISE ID

International Classification:

H03B 5/24
H03B 5/04

Abstract:

Apparatuses and methods are disclosed for oscillators that are substantially insensitive to supply voltage variations. In one such example apparatus, a capacitance circuit is configured to be charged and discharged. Charging and discharging circuits are coupled to the capacitance circuit and configured to charge and discharge, respectively, the capacitance circuit by charging and discharging currents responsive to charge and discharge signals. A control circuit is coupled to the charging circuit and the discharging circuit, and is configured to provide the charge and discharge signals responsive to a voltage of the capacitance circuit, and is further configured to provide an oscillation signal responsive to the voltage of the capacitance circuit. The charging current, the discharging current, or both the charging and discharging currents are proportional to a difference between a first reference voltage and a second reference voltage.

US Patent:

20150048880, Feb 19, 2015

Filed:

Aug 14, 2013

Appl. No.:

13/966298

Inventors:

- Tao-Yuan Hsien, TW
Bin LIU - Boise ID, US

Assignee:

NANYA TECHNOLOGY CORPORATION - Tao-Yuan Hsien

International Classification:

H03K 5/1252

US Classification:

327552, 327551

Abstract:

A glitch filter is disclosed herein. The glitch filter includes a high glitch filter circuit, a low glitch filter and a control circuit. The high glitch filter circuit is configured for generating a pull-up control signal in accordance with the input signal. The low glitch filter circuit is configured for generating a pull-down control signal in accordance with the input signal. The control circuit is configured for determining the logic level of the output of the glitch filter in accordance with the pull-up control signal and the pull-down control signal. A filtering method for filtering glitches is disclosed herein as well.

US Patent:

20140327307, Nov 6, 2014

Filed:

May 2, 2013

Appl. No.:

13/886146

Inventors:

- Tao-Yuan Hsien, TW
Bin LIU - Boise ID, US

Assignee:

NANYA TECHNOLOGY CORPORATION - TAO-YUAN HSIEN

International Classification:

H02M 1/08

US Classification:

307 31

Abstract:

A voltage tracking circuit, which comprises a voltage generating device, a first operational amplifier, a first voltage generator, and a diode-connected device. The voltage generating device provides a fixed voltage. The first operational amplifier has a first input terminal that can receive the fixed voltage, a second input terminal that is coupled with a protected device model, and an output terminal. The first voltage generator connects to the output terminal of the first operational amplifier and to a voltage limiter that is coupled with devices under protection. The diode-connected device is in a feedback loop that connects the second input terminal of the first operational amplifier to the first voltage generator.

US Patent:

20140176249, Jun 26, 2014

Filed:

Oct 19, 2012

Appl. No.:

13/882144

Inventors:

- Boise ID, US
Bin Liu - Boise ID, US

International Classification:

H03B 9/14

US Classification:

331111

Abstract:

Apparatuses and methods are disclosed for oscillators that are substantially insensitive to supply voltage variations. In one such example apparatus, a capacitance circuit is configured to be charged and discharged. Charging and discharging circuits are coupled to the capacitance circuit and configured to charge and discharge, respectively, the capacitance circuit by charging and discharging currents responsive to charge and discharge signals. A control circuit is coupled to the charging circuit and the discharging circuit, and is configured to provide the charge and discharge signals responsive to a voltage of the capacitance circuit, and is further configured to provide an oscillation signal responsive to the voltage of the capacitance circuit. The charging current, the discharging current, or both the charging and discharging currents are proportional to a difference between a first reference voltage and a second reference voltage.