Bing Qing Zhang

US Patent:

6421798, Jul 16, 2002

Filed:

Jul 14, 1999

Appl. No.:

09/353704

Inventors:

Lixin Lin - Dallas TX
Liming Qu - Dallas TX
Bing Zhang - Addison TX
Toh Kay Huat - Singapore, SG

Assignee:

Computer Service Technology, Inc. - Dallas TX

International Classification:

G11C 2900

US Classification:

714718

Abstract:

A method of testing memory of a system is disclosed which operates the system from a second area of system address space which is outside of a first area of system address space, the system having one or more physical memory devices associated with the first area of system address space. The memory locations associated with the first area of the system address space are tested for predetermined characteristics after which the one or more tested physical memory devices are replaced with respective untested physical memory devices without dropping power to the system, and tested by repeating the test cycle. The system is prevented from operating in the first area of system address space and forced to operate from the second area, thereby preventing system interruptions when replacing the physical memory devices for testing.