Brian Andrew Bryce

age ~42

from Silver Spring, MD

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Also known as:

Brian A Bryce

Connected to:

Brian Bryce Phones & Addresses

Silver Spring, MD
Pasadena, CA
Chevy Chase, MD
12404 Linganore Ridge Dr, Monrovia, MD 21770 • (301)8653580
Dobbs Ferry, NY
Ithaca, NY
Greenbelt, MD
Elkhart, IN
381 Broadway APT 1C, Dobbs Ferry, NY 10522

Work

Position:

Professional/Technical

Education

Degree:

High school graduate or higher

Us Patents

Scanned Probe Microscopy (Spm) Probe Having Angled Tip
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US Patent:

8539611, Sep 17, 2013
Filed:

Jul 12, 2012
Appl. No.:

13/547378
Inventors:

Mark C. Reuter - Montrose NY, US
Brian A. Bryce - Ithaca NY, US
Bojan R. Ilic - Ithaca NY, US
Sandip Tiwari - Ithaca NY, US
Assignee:

International Business Machines Corporation - Armonk NY
Cornell University - Ithaca NY
International Classification:

G01Q 60/38
H01L 21/306
B82Y 40/00
US Classification:

850 32, 850 33, 850 40, 850 45, 850 60, 850 29
Abstract:

A method of creating a probe for scanned probe microscopy is disclosed. The method includes providing a wafer having a support wafer layer and a device layer. The method includes masking the wafer with a masking layer. The method includes removing a portion of the masking layer at the device layer. The method includes etching the wafer along the portion of the masking layer that has been removed to create a crystal facet surface that is oriented at a tilt angle. The method includes epitaxially growing a tip along the crystal facet surface.

Scanned Probe Microscopy (Spm) Probe Having Angled Tip
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US Patent:

20140007308, Jan 2, 2014
Filed:

Jul 2, 2012
Appl. No.:

13/539778
Inventors:

Mark C. Reuter - Montrose NY, US
Brian A. Bryce - Ithaca NY, US
Bojan R. Ilic - Ithaca NY, US
Sandip Tiwari - Ithaca NY, US
Assignee:

CORNELL UNIVERSITY - Ithaca NY
INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:

G01Q 70/08
G01Q 60/38
US Classification:

850 40, 850 56
Abstract:

A probe for scanned probe microscopy is provided. The probe includes a cantilever beam and a tip. The cantilever beam extends along a generally horizontal axis. The cantilever beam has a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis. The tip projects outwardly from the crystal facet surface.

Resumes

Master Drywaller

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Industry:

Professional Training & Coaching

Work:

Hamilton Products Group
Master Drywaller

Senior Professional Staff

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Location:

Silver Spring, MD

Industry:

Defense & Space

Work:

The Johns Hopkins University Applied Physics Laboratory
Senior Professional Staff
Harvey Mudd College Jul 1, 2015 - Jan 2018
Assistant Professor of Engineering
National Institute of Standards and Technology Mar 2014 - Jul 2015
National Research Council Postdoctoral Fellow
Ibm Dec 2012 - Dec 2013
Post-Doctoral Researcher
Cornell University Apr 2007 - Nov 2012
Graduate Researcher

Education:

Cornell University 2006 - 2012
Doctorates, Doctor of Philosophy, Applied Physics, Philosophy University of Maryland 2001 - 2005
Bachelors, Bachelor of Science, Physics, Electronics Engineering

Skills:

Nanotechnology
Mems
Physics
Programming
Characterization
Afm
Semiconductor Fabrication
Semiconductor Device
Electronics
Pcb Layout Design
Vlsi Cad
Fpga
Microwave Engineering
Embedded Systems
Vhdl
Verilog
Tem