Brian J Warner

US Patent:

50240951, Jun 18, 1991

Filed:

Dec 5, 1989

Appl. No.:

7/446385

Inventors:

Brian Warner - Moonachie NJ

International Classification:

G01N 334

US Classification:

73661

Abstract:

A method of diagnosis utilizing a diagnostic locator for detecting sources of electronic circuit malfunction caused by fractured solder connections or other kinetically locatable electronic circuit malfunctions comprises a diagnostic locator using kinetic energy at sonic frequencies which is discriminately applied to particular circuit areas to reveal mechanical intermittance on an accurate basis. The locator includes an elongated non-conductive test probe which is mounted within a housing at one end containing a transducer for kinetically activating the probe. An operator may adjust the kinetic energy being released at the probe tip for greater or lesser propagation upon electronic circuitry being diagnosed. This diagnosis of mechanically malfunctioning electronic circuitry is accomplished while monitoring the output of the circuitry in a conventional manner.