Bruce R Youmans

US Patent:

6018390, Jan 25, 2000

Filed:

Jan 27, 1998

Appl. No.:

9/014111

Inventors:

Bruce Youmans - Sierra Vista AZ
Victor Vali - Laguna Hills CA
Colleen Fitzpatrick - Fountain Valley CA

Assignee:

Rice Systems, Inc. - Irvine CA

International Classification:

G01B 902

US Classification:

356345

Abstract:

A sensor, an optical accelerometer, which is sensitive enough for the measurement of nano-g's as well as thousands of g's. The sensor is created by an optical waveguide coil which is secured to a substrate. At one end of the waveguide coil, a mirror reflects the emitting light back into the waveguide coil. Positioned along one side of the substrate, a proof mass is adapted to exert force against and deform the optical waveguide coil during acceleration of the sensor. An identical optical waveguide coil is secured to the opposing side of the substrate with its associated proof mass positioned on the side of the substrate opposite the other side's proof mass. A beamsplitter communicates light into the ends of the two waveguide coils and then a monitor uses the light being emitted from the ends of the coils to measure the g's being applied.

US Patent:

52125831, May 18, 1993

Filed:

Jan 8, 1992

Appl. No.:

7/818315

Inventors:

Victor Vali - Laguna Hills CA
David B. Chang - Tustin CA
Bruce R. Youmans - Temple City CA

Assignee:

Hughes Aircraft Company - Los Angeles CA

International Classification:

G02F 103
G02F 133

US Classification:

359245

Abstract:

An adaptive electroopical lens system for use in optical data storage systems, optical phased arrays, laser or other optical projectors, and raster scanning devices, and the like. The invention provides an electrooptical means for scanning an optical beam or moving an optical storage or retrieval point. Beam movement is achieved electrooptically, by changing the index of refraction of an electrooptical material by controlling electric fields applied thereto. A plurality of electrodes are disposed on one surface of the electrooptic material and a ground electrode is disposed on the other. The electrodes are adapted to apply electric fields derived from a voltage source to the electroopic material that selectively change its index of refraction and provides for a predetermined index of refraction profile along at least one dimension thereof, thus forming a lens. By appropriately forming the electrode pattern and properly controlling the voltages applied thereto, differing lens shapes may be formed. Since the response times of the electrooptic materials employed in the present invention are on the order of nanoseconds (10. sup.

US Patent:

46627510, May 5, 1987

Filed:

Sep 24, 1985

Appl. No.:

6/779744

Inventors:

Willis C. Goss - Altadena CA
Bruce R. Youmans - Temple City CA
Noble M. Nerheim - Arcadia CA
Randall K. Bartman - Pasadena CA

Assignee:

The United States of America as represented by the Administrator of the
National Aeronautics and Space Administration - Washington DC

International Classification:

G01B 902

US Classification:

356350

Abstract:

An improved optical gyroscope is provided, of the type that passes two light components in opposite directions through an optic fiber coil, and which adds a small variable frequency to one of the light components to cancel the phase shift due to rotation of the coil. The amount of coil rotation from an initial orientation, is accurately determined by combining the two light components, one of which has a slightly increased frequency, to develop beats that each represent a predetermined angle of rotation. The direction of rotation is obtained by combining the two light components on a photodetector, intermittently phase shifting a single light component by 90. degree. , and comparing the direction of change of photodetector output (+ or -) caused by the 90. degree. shift, with the slope (+ or -) of the photodetector output at about the same time, when there is a 90. degree. shift.

US Patent:

62590898, Jul 10, 2001

Filed:

May 15, 1998

Appl. No.:

9/079581

Inventors:

Victor Vali - Laguna Hills CA
Bruce Youmans - Sierra Vista AZ
Colleen Fitzpatrick - Fountain Valley CA

Assignee:

Rice Systems, Inc. - Irvine CA

International Classification:

G01C 1972

US Classification:

25023112

Abstract:

A gyroscope which utilizes light waves to sense motion in the plane of the substrate. The gyroscope has a primary optical waveguide which is adapted to pass light from a single light source through the primary optical waveguide in both directions. The light exiting from each end of the primary optical waveguide is withdrawn and passed through two dedicated waveguides (one dedicated waveguide for each end of the primary optical waveguide). Preferably, these two dedicated waveguides have differing times for light travel such that one of the dedicated waveguides emits its light one-quarter wavelength behind the other dedicated waveguide. The light being emitted from each dedicated waveguide is then combined permitting a sensor to monitor any shifts between the two light signals as a monitor to motion of the primary optical waveguide.

US Patent:

50188275, May 28, 1991

Filed:

Oct 3, 1989

Appl. No.:

7/426125

Inventors:

Patrick Brownrigg - Long Beach CA
Victor Vali - Laguma Hills CA
Bruce Youmans - Temple City CA

International Classification:

G02B 616

US Classification:

350 9630

Abstract:

An optical fiber is constructed by selecting a first material for a core of the optical fiber. The first material has a known coefficient of thermal expansion,. alpha. sub. 1, and a known temperature dependent rate of change, dn/dT, of an index of refraction, n. A second material (cladding) has a predetermined coefficient of thermal expansion,. alpha. sub. 2, and a radius, R. sub. 2, about the axis of the fiber. The radius, R. sub. 2, of the cladding is determined such that an effective coefficient of thermal expansion for the fiber is substantially equal to the negative of the product of the reciprocal of the index of refraction of the first material and the temperature dependent rate of change of the index of refraction of the first material, i. e. . alpha. =(-1/n)dn/dT.