Chad M Shaffer

US Patent:

20130197822, Aug 1, 2013

Filed:

Jan 26, 2012

Appl. No.:

13/359262

Inventors:

Chad Martin Shaffer - State College PA, US
Peter Renzel - Dueren, DE
Jerome Poirier - Forges Les Bains, FR
Michael Maria Berke - Koeln, DE
Douglas Paul Lutz - Lewistown PA, US
Rai Mohan Dasarathan - Bangalore, IN
Anandamurugan S - Bangalore, IN

International Classification:

G06F 19/00

US Classification:

702 39

Abstract:

A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.

US Patent:

20140178853, Jun 26, 2014

Filed:

Dec 21, 2012

Appl. No.:

13/725091

Inventors:

- Schenectady NY, US
Robert Carroll Ward - State College PA, US
Francois Xavier de Fromont - State College PA, US
Chad Martin Shaffer - State College PA, US

Assignee:

GENERAL ELECTRIC COMPANY - Schenectady NY

International Classification:

G09B 5/00

US Classification:

434365

Abstract:

A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.