Chad M Shaffer

US Patent:

20130197822, Aug 1, 2013

Filed:

Jan 26, 2012

Appl. No.:

13/359262

Inventors:

Chad Martin Shaffer - State College PA, US
Peter Renzel - Dueren, DE
Jerome Poirier - Forges Les Bains, FR
Michael Maria Berke - Koeln, DE
Douglas Paul Lutz - Lewistown PA, US
Rai Mohan Dasarathan - Bangalore, IN
Anandamurugan S - Bangalore, IN

International Classification:

G06F 19/00

US Classification:

702 39

Abstract:

A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.

US Patent:

20220251903, Aug 11, 2022

Filed:

Feb 9, 2022

Appl. No.:

17/668149

Inventors:

- New Bethlehem PA, US
Chad Shaffer - New Bethlehem PA, US

International Classification:

E06B 11/02
E04H 12/22
E05B 65/00

Abstract:

A gate may generally include a gatepost and a plurality of rails pivotally connected to the gatepost and having a plurality of posts hingedly attached to at least one of the plurality of rails. The gate may include a lift system having a translating device in communication with a sprocket, wherein the lift system provides an adjustable force to rotate the plurality of rails from a horizontal position to an upward position. The adjustable force may be provided by a tumbuckle. The gate may include a ground anchor system that allows axial rotation of the plurality of rails about a longitudinal axis of the gatepost.

US Patent:

20190186199, Jun 20, 2019

Filed:

Dec 17, 2018

Appl. No.:

16/222349

Inventors:

- NEW BETHLEHEM PA, US
Chad Shaffer - New Bethlehem PA, US

Assignee:

KLIMEK ENTRY GATES, INC. - NEW BETHLEHEM PA

International Classification:

E06B 11/02
E04H 12/22
E05B 65/00
E05F 1/10

Abstract:

The gate generally includes a gatepost, and a plurality of rails pivotally connected to the gatepost and having a plurality of posts hingedly attached thereto. Hinged attachment of the plurality of posts allows them to fold substantially parallel with the plurality of rails when they in the vertical position. The gate includes a unique lift system having a translating device in communication with a sprocket, wherein the lift system provides an adjustable force to rotate the plurality of rails from a horizontal position to a vertical position. The translating device generally includes a first end attached to the gatepost and a second end attached to one of the plurality of rails, wherein the adjustable force may be provided by a turnbuckle positioned there between. The gate may further include a ground anchor system that allows axial rotation of the plurality of rails about the gatepost.

US Patent:

20140178853, Jun 26, 2014

Filed:

Dec 21, 2012

Appl. No.:

13/725091

Inventors:

- Schenectady NY, US
Robert Carroll Ward - State College PA, US
Francois Xavier de Fromont - State College PA, US
Chad Martin Shaffer - State College PA, US

Assignee:

GENERAL ELECTRIC COMPANY - Schenectady NY

International Classification:

G09B 5/00

US Classification:

434365

Abstract:

A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.