Chen Heping

US Patent:

20050284937, Dec 29, 2005

Filed:

Jun 25, 2004

Appl. No.:

10/877083

Inventors:

Ning Xi - Okemos MI, US
Chen Heping - East Lansing MI, US
Quan Shi - East Lansing MI, US

International Classification:

G06K005/00

US Classification:

235437000

Abstract:

An automated dimensional inspection system is provided that modifies sensor planning based on real-time measurement feedback. The dimensional inspection system includes a sensor planner, an error map generator, and a sensor affixed to a movable member. The sensor planner is adapted to receive three dimensional design data for a workpiece to be measured and generate path data in part based on the dimensional design data for the workpiece, where the path data is indicative of a path for moving the sensor in relation to the surface of the workpiece. The error map generator is adapted to receive the dimensional design data and the three dimensional measurement data for the workpiece, and determine error data between the measurement data and the dimensional design data. Based on the error data, the sensor planner is able to further modify the path data for the sensor to increase the measurement accuracy.