Cheng Li

US Patent:

6571005, May 27, 2003

Filed:

Apr 21, 2000

Appl. No.:

09/556497

Inventors:

Cheng Li - Los Angeles CA
Wing Hung Wong - Los Angeles CA

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

G06K 900

US Classification:

382133

Abstract:

A characteristic intensity of a feature in image data generated by scanning a microarray probe is determined. A set of pixels of the image data that nominally represent the feature is identified. The pixels each have an value (such as an intensity value) associated therewith. For each of a plurality of subsets of the set of pixels, a variation statistic value is determined that corresponds to a variation in the values associated with the pixels of that subset. One of the subsets of pixels is chosen based on the determined variation statistic values. A method is also described to relate a first expression array of probes to a second expression array of probes. A subset of the probe for the arrays is determined based on a comparison of the ordering of the subset of the probes of the second array, according to a particular characteristic of the probes, to the ordering of corresponding probes in the first array according to the particular characteristic of the probes. A relationship of the second expression array to the first expression array is determined based on the subset of probes o f the second expression array to the corresponding probes of the first array.