Chia K Lee

US Patent:

6366874, Apr 2, 2002

Filed:

May 24, 1999

Appl. No.:

09/317691

Inventors:

Chia Huei Lee - San Jose CA
Jensen Tsai - San Jose CA
Meng-Hui Chen - Chutung Town, TW
Banghwa Ho - Hsinchu, TW
Changson Teng - San Jose CA

Assignee:

Novas Software, Inc. - San Jose CA
Springsoft, Inc. - Hsinchu

International Classification:

G06F 1750

US Classification:

703 14, 716 18, 716 3

Abstract:

Hardware description language (HDL)-centered design system and methodology uses HDL specification effectively as master depository for design intent or knowledge. Through network browser, designers conveniently navigate or explore design graphically. Designers selectively review or save design in entirety or portions. Design capture, analysis, and manipulation are based on HDL specification, either directly through text file editing, or indirectly through use of graphical tools.

US Patent:

47437707, May 10, 1988

Filed:

Sep 22, 1986

Appl. No.:

6/909926

Inventors:

Chia S. Lee - Cerritos CA

Assignee:

Mitutoyo Mfg. Co., Ltd. - Tokyo

International Classification:

G01B 1124

US Classification:

250560

Abstract:

A profile-measuring light probe includes: an illuminator for irradiating a fine spot of light on a subject to be measured; an objective lens for forming an image of the fine spot on an image plane; and a relay lens for converting the light from the fine spot into a generally parallel ray. Further, the light probe includes a window plate constituted by an entrance prism for taking in the generally parallel ray emitted from the relay lens; a flat glass for subjecting the taken-in ray to multiple internal reflections and transmitting the same, and an exit prism for outputting the ray thus transmitted to the outside. The light probe measures the distribution of light quantity of the light emitted from the window plate to thereby measure a profile of the subject to be measured. With the above-described arrangement, it becomes possible for the light probe to perform the measuring through the utilization of a change in reflection factor of a light inciding in the proximity of a critical angle without using a critical angle prism.