Chin Mei Lin

US Patent:

8312401, Nov 13, 2012

Filed:

Jan 13, 2011

Appl. No.:

13/005932

Inventors:

Iyun Leu - Hsinchu, TW
Chin Hsen Lin - Fremont CA, US

Assignee:

Elitetech Technology Co., Ltd. - Zhudong Town

International Classification:

G06F 17/50

US Classification:

716112

Abstract:

A method for smart defect review is disclosed. The method includes pre-processing a design layout into a plurality of layout based pattern groups, dividing the design layout into a plurality of cells, overlapping the cells belong to the same layout based pattern groups, extracting a plurality of defect data of all defects on a wafer, constructing a plurality of layout based defect composite pattern groups, executing layout pattern match to obtain each individual layout based defect composite pattern group, performing some defect sample selection rules to each layout based defect composite pattern group, sorting the layout based defect composite pattern groups into different defect types, obtaining a defect image file by reviewing different sample number of defect image from each layout based defect composite pattern group, and generating a defect pattern library or a defect yield prediction by performing a defect yield diagnosis to the defect image file.

US Patent:

20210334194, Oct 28, 2021

Filed:

Apr 22, 2020

Appl. No.:

16/855565

Inventors:

- Armonk NY, US
Anup Kalia - White Plains NY, US
Chin Lin - Elmsford NY, US
Raghav Batta - Ossining NY, US
Saurabh Sinha - Danbury CT, US
John Rofrano - Mahopac NY, US
Maja Vukovic - New York NY, US

International Classification:

G06F 11/36
G06F 11/32

Abstract:

Systems, computer-implemented methods, and computer program products to facilitate generation of microservices from a monolithic application based on runtime traces are provided. According to an embodiment, a system can comprise a memory that stores computer executable components and a processor that executes the computer executable components stored in the memory. The computer executable components can comprise a model component that learns cluster assignments of classes in a monolithic application based on runtime traces of executed test cases. The computer executable components can further comprise a cluster component that employs the model component to generate clusters of the classes based on the cluster assignments to identify one or more microservices of the monolithic application.

US Patent:

20210003385, Jan 7, 2021

Filed:

Jun 26, 2020

Appl. No.:

16/913645

Inventors:

- Cupertino CA, US
Arnaud Laflaquiere - Greenoble, FR
Chin Han Lin - Cupertino CA, US
Keith Lyon - Cupertino CA, US
Marc A. Drader - Waterloo CA, US
Weiping Li - Pleasanton CA, US

International Classification:

G01B 9/02
H01S 5/026
H01S 5/30
H01S 5/183
H01S 5/343

Abstract:

Disclosed herein are self-mixing interferometry (SMI) sensors, such as may include vertical cavity surface emitting laser (VCSEL) diodes and resonance cavity photodetectors (RCPDs). Structures for the VCSEL diodes and RCPDs are disclosed. In some embodiments, a VCSEL diode and an RCPD are laterally adjacent and formed from a common set of semiconductor layers epitaxially formed on a common substrate. In some embodiments, a first and a second VCSEL diode are laterally adjacent and formed from a common set of semiconductor layers epitaxially formed on a common substrate, and an RCPD is formed on the second VCSEL diode. In some embodiments, a VCSEL diode may include two quantum well layers, with a tunnel junction layer between them. In some embodiments, an RCPD may be vertically integrated with a VCSEL diode.

US Patent:

20200005716, Jan 2, 2020

Filed:

Sep 11, 2019

Appl. No.:

16/567972

Inventors:

- Cupertino CA, US
Kingsuk Brahma - Mountain View CA, US
Jie Won Ryu - Santa Clara CA, US
Shengkui Gao - San Jose CA, US
Shiping Shen - Cupertino CA, US
Majid Gharghi - San Carlos CA, US
Hyunwoo Nho - Palo Alto CA, US
Injae Hwang - Cupertino CA, US
Kavinaath Murugan - Scarborough, CA
Sun-Il Chang - San Jose CA, US
Chin Wei Lin - San Jose CA, US
Hyunsoo Kim - Mountain View CA, US
Rui Zhang - Sunnyvale CA, US
Jesse Aaron Richmond - San Francisco CA, US
Yun Wang - Cupertino CA, US
Hung Sheng Lin - San Jose CA, US
Alex H. Pai - Milpitas CA, US
Chaohao Wang - Sunnyvale CA, US
Wei H. Yao - Palo Alto CA, US

International Classification:

G09G 3/3283
G09G 3/3291
G09G 3/3241
G09G 3/3258

Abstract:

The present disclosure relates generally to systems and methods that may reduce a reduction in visual artifacts related to hysteresis of a light emitting diode (LED) electronic display. In one example, an electronic device may include a controller. The controller is may provide a signal to a pixel of a display of the electronic device while at least a portion of the display is turned off. The signal may include a first current and a second current. The first current may be designed to increase an ambient temperature corresponding to the pixel. The second current may be generated as part of an active panel conditioning operation. By applying the first current and the second current, hysteresis settling times from the pixel may improve, therefore improving speeds of sensing and compensation operations of the electronic device.

US Patent:

20180283984, Oct 4, 2018

Filed:

Apr 9, 2018

Appl. No.:

15/947882

Inventors:

- Cupertino CA, US
Brian S. Medower - San Jose CA, US
Chin Han Lin - Cupertino CA, US

International Classification:

G01M 11/02
G01J 3/02

Abstract:

Optical apparatus includes a primary radiation source, which emits first optical radiation along a first optical axis. A DOE includes at least an entrance surface, upon which the first optical radiation from the primary radiation source is incident, and an exit surface, through which one or more primary diffraction orders of the first optical radiation are emitted from the DOE. At least one secondary radiation source is configured to direct second optical radiation to impinge on the DOE along a second optical axis, which is non-parallel to the first optical axis, causing at least a part of the second optical radiation to be diffracted by the DOE such that one or more secondary diffraction orders of the second optical radiation are emitted through the entrance face of the DOE. At least one detector is configured to sense at least one of the secondary diffraction orders of the second optical radiation.

US Patent:

20170324949, Nov 9, 2017

Filed:

May 4, 2016

Appl. No.:

15/146454

Inventors:

- Cupertino CA, US
Chin Han Lin - Santa Clara CA, US

International Classification:

H04N 13/02
H04N 13/02
H04N 13/02
H04N 13/02

Abstract:

Systems, methods, and computer readable media to resolve three dimensional spatial information of cameras used to construct 3D images. Various embodiments perform communication synchronization between a first image capture system and one or more other image capture systems and generate a first flash pulse that projects a light pattern into an environment. An image is captured that includes the light pattern and a modulated optical signal encoded with an identifier of one of the first image capture system and related-camera information. A second flash from another image capture systems may flash at a second time based on the communication synchronization. During the second flash, the first image capture system captures a second image of the environment. Based on the first and second images, the first image capture system determines the orientation of the second image capture system relative to the first image capture system.

US Patent:

20170227416, Aug 10, 2017

Filed:

Feb 10, 2016

Appl. No.:

15/019978

Inventors:

- Cupertino CA, US
Brian S. Medower - Cupertino CA, US
Chin Han Lin - Cupertino CA, US

International Classification:

G01M 11/02
G01J 3/18

Abstract:

Optical apparatus includes a primary radiation source, which emits first optical radiation along a first optical axis. A DOE includes at least an entrance surface, upon which the first optical radiation from the primary radiation source is incident, and an exit surface, through which one or more primary diffraction orders of the first optical radiation are emitted from the DOE. At least one secondary radiation source is configured to direct second optical radiation to impinge on the DOE along a second optical axis, which is non-parallel to the first optical axis, causing at least a part of the second optical radiation to be diffracted by the DOE such that one or more secondary diffraction orders of the second optical radiation are emitted through the entrance face of the DOE. At least one detector is configured to sense at least one of the secondary diffraction orders of the second optical radiation.