Andrew Marshall - Dallas TX Ching L. Lin - Richardson TX Jingwei Xu - Dallas TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
H02H 300
US Classification:
361 939
Abstract:
A controllable current limiting circuit (30) that, when used with a low precision current limiting circuit (10), will limit the current of the output driver transistor M1 to a relatively flat response over a broad temperature range. The current is limited by setting the voltage across a resistance, R1, to a certain value. To overcome temperature induced variations in this voltage, the compensation circuit (20) generates a current that varies with temperature. This current is injected into a terminal of the resistance, R1. This current is generated in such as a manner to ensure that the current flowing in the output driver transistor M1 is relatively constant over a wide temperature range.
Westchester Anesthesiologists 701 N Broadway, Tarrytown, NY 10591 (914)4285454 (phone), (914)2536900 (fax)
Education:
Medical School Natl Taiwan Univ Coll of Med, Taipei, Taiwan (385 02 Prior 1/71) Graduated: 1973
Languages:
English
Description:
Dr. Lin graduated from the Natl Taiwan Univ Coll of Med, Taipei, Taiwan (385 02 Prior 1/71) in 1973. He works in Sleepy Hollow, NY and specializes in Anesthesiology. Dr. Lin is affiliated with Phelps Memorial Hospital Center.
Mar 2007 to 2000 Principal Equipment Maintenance TechnicianCypress Semiconductor San Jose, CA Nov 1990 to Mar 2007 Principal Equipment Maintenance TechnicianCypress Semiconductor San Jose, CA Nov 1987 to Nov 1990 Equipment Maintenance TechnicianCypress Semiconductor San Jose, CA Nov 1985 to Nov 1987 Equipment SpecialistMostek Coperation Dallas, TX Aug 1984 to May 1985 Fab OperatorLei Ban Industrial Co
Mar 1981 to Mar 1984 Maintenance Technician
Education:
National Taipei Institute of Technology 1975 to 1980 BS in Electronics Engineering
For the study, published in the July 28 online edition of Stroke, a team led by Herng-Ching Lin, a professor at Taipei Medical University, collected data on 23,199 people who suffered a traumatic brain injury between 2001 and 2003. They compared these patients with 69,597 patients without traumatic