Christopher D Mcfarland

US Patent:

20220292010, Sep 15, 2022

Filed:

May 24, 2022

Appl. No.:

17/752370

Inventors:

- Denver CO, US
Christopher McFarland - Vienna VA, US
Hind Kraytem - London, GB
Jean Caillé - Paris, FR
Ludovic Lay - Zurich, CH

International Classification:

G06F 11/36
G06F 8/70
G06F 8/10

Abstract:

Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.