Chun G Wang

US Patent:

6707850, Mar 16, 2004

Filed:

Aug 1, 2000

Appl. No.:

09/630263

Inventors:

Roy Baxter Blake - Denville NJ
Jianqing Lin - Pleasanton CA
Chun Wang - Fremont CA

Assignee:

Agere Systems Inc. - Allentown PA

International Classification:

H03H 730

US Classification:

375233

Abstract:

A Decision-Feedback Equalizer (DFE) includes a Maximum Likelihood Sequence Estimator (MLSE) for estimating a symbol sequence. The DFE also includes a signal level decoder, and a delay line having a first plurality of taps being connected to the output of the signal level decoder, and a second plurality of taps being connected to the output of the MLSE. Furthermore, the DFE has an error signal generator having a first input connected to the input of the signal level decoder, and a second input connected to the output of the signal level decoder for adjusting coefficients of the taps. The symbol delay line has been split into two sections with the output of the MLSE being fed to part of the delay line. Because symbols in the delay line are adjusted with the coefficients and fedback to the signal level decoder, the output of the MLSE is able to correct symbols whenever its output is available. In such a symbol updating approach, error propagation in the delay line is avoided during an error event.

US Patent:

20060291042, Dec 28, 2006

Filed:

May 17, 2006

Appl. No.:

11/435959

Inventors:

Robert Alfano - Bronx NY, US
Chun Wang - College Point NY, US
Pavel Shumyatsky - Tenafly NJ, US
Manuel Zevallos L. - Woodhaven NY, US

International Classification:

G02B 21/00

US Classification:

359368000

Abstract:

The computer-controlled optical scanning high magnification microscope imaging system with a large field of view disclosed herein overcomes a previous inability to achieve simultaneous high magnification and large field of view in microscopes. The subject imaging system includes galvanometer scanners, a CCD camera and high brightness LED sources at different wavelengths for rapid acquisition of a large number of high-resolution segmented tile images with a magnification of 800× each. The numerous segmented tiles combine to form a larger viewing field of the target, resulting in a compound image with an effective enlarged viewing area of 1.6×1.2 mm. The speed and sensitivity of the system make it suitable for high resolution image monitoring of a small segmented area of dimensions 320×240 μmwith a 4 μm resolution. The microscope can zoom in on each segment of the target without lost of resolution to attain a great degree of spatial detail. With its special capacities, this microscope would be beneficial to medicine, biology, semiconductor inspection, device analysis and quality control, as well as with multiphoton and fluorescence microscopes to image large fields with high resolution.